Inventor · disambiguated record
Yotam Sofer
Also filed as: SOFER Yotam
9 granted patents·4 citations·filing 2015–2022
77Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD9
Top patents by PatentIndex Score
9 records- 0173US10504805B2Method of examining defects in a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Dec 10, 2019·2 cites·20 claims
- 0273US10190991B2Method for adaptive sampling in examining an object and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Jan 29, 2019·2 cites·20 claims
- 0364US11940390B2Selecting a representative subset of potential defects to improve defect classifier training and estimation of expected defects of interestAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Mar 26, 2024·0 cites·20 claims
- 0456US10720367B2Process window analysisAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jul 21, 2020·0 cites·20 claims
- 0555US11360030B2Selecting a coreset of potential defects for estimating expected defects of interestAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jun 14, 2022·0 cites·16 claims
- 0654US10937706B2Method of examining defects in a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Mar 2, 2021·0 cites·20 claims
- 0748US10605745B2Guided inspection of a semiconductor wafer based on systematic defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Mar 31, 2020·0 cites·17 claims
- 0845US10312161B2Process window analysisAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Jun 4, 2019·0 cites·16 claims
- 0942US11060981B2Guided inspection of a semiconductor wafer based on spatial density analysisAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jul 13, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →