Inventor · disambiguated record
Young-Hoon Sohn
Also filed as: SOHN YOUNG HOON
14 granted patents·8 pending applications·37 citations·filing 2010–2024
87Inventor score
Files withSAMSUNG ELECTRONICS CO LTD17HANWHA TOTALENERGIES PETROCHEMICAL CO LTD2SOHN YOUNG-HOON2LEE HYUN-HO1
Top patents by PatentIndex Score
22 records- 0190US7994813B2Semiconductor device capable of testing a transmission line for an impedance calibration codeSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Aug 9, 2011·17 cites·19 claims
- 0287US10001444B2Surface inspecting methodSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 19, 2018·4 cites·19 claims
- 0384US9036895B2Method of inspecting waferSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted May 19, 2015·6 cites·20 claims
- 0482US8093804B2Organic electroluminescent display device having a novel concept for luminous efficiencyLEE HYUN-HO·Filed 2010·Granted Jan 10, 2012·6 cites·8 claims
- 0572US8703405B2Methods of generating three-dimensional process window qualificationSOHN YOUNG-HOON·Filed 2012·Granted Apr 22, 2014·2 cites·20 claims
- 0666US8902412B2Defect inspection apparatus and defect inspection method using the sameSOHN YOUNG-HOON·Filed 2012·Granted Dec 2, 2014·1 cites·19 claims
- 0763US8759763B2Method and apparatus to measure step height of device using scanning electron microscopeSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Jun 24, 2014·1 cites·19 claims
- 0863US2025198941A1Defect inspection system and defect inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0958US2024219314A1Optical measurement apparatus, optical measurement method using the same, and method for manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1055US2025122314A1Separation method for a reaction product ofolefin oligomerization, and method and device for preparing ethylene oligomer utilizing the separation methodHANWHA TOTALENERGIES PETROCHEMICAL CO LTD·Filed 2024·Application pending·0 cites
- 1153US2025122134A1Separation method for a mixture comprising a solvent and c4 or higher linear alpha olefins, and method and device for preparing ethylene oligomer utilizing the separation methodHANWHA TOTALENERGIES PETROCHEMICAL CO LTD·Filed 2024·Application pending·0 cites
- 1252US10969428B2Method of inspecting pattern defectSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Apr 6, 2021·0 cites·14 claims
- 1351US10585115B2Scanning probe inspectorSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Mar 10, 2020·0 cites·18 claims
- 1448US11181831B2Methods of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 23, 2021·0 cites·20 claims
- 1545US11017525B2Semiconductor pattern detecting apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted May 25, 2021·0 cites·20 claims
- 1645US10527556B2Optical measuring method and apparatus, and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jan 7, 2020·0 cites·17 claims
- 1742US10989520B2Methods for nondestructive measurements of thickness of underlying layersSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Apr 27, 2021·0 cites·17 claims
- 1841US10852259B2Apparatus for X-ray inspection, and a method for manufacturing a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Dec 1, 2020·0 cites·16 claims
- 1939US2019130552A1Methods of inspecting defect and methods of fabricating a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
- 2039US2019114755A1Semiconductor chip inspection deviceSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
- 2138US2020182777A1Substrate inspection apparatus, method of calibrating the substrate inspection apparatus, and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
- 2232US2015248127A1Process management systems using comparison of statistical data to process parameters and process management devicesSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →