Inventor · disambiguated record
Yoshifumi Takahashi
Also filed as: TAKAHASHI YOSHIFUMI
11 granted patents·2 pending applications·145 citations·filing 1987–2025
87Inventor score
Files withMURATA MANUFACTURING CO5ANRITSU CORP4ANRITSU INFIVIS CO LTD2NAGAI HIDETADA1NIPPON HUME PIPE1
Top patents by PatentIndex Score
13 records- 0175US6023497AApparatus for detecting foreign matter with high selectivity and high sensitivity by image processingANRITSU CORP·Filed 1996·Granted Feb 8, 2000·52 cites·11 claims
- 0269US5458225ACoin discriminating apparatusANRITSU CORP·Filed 1992·Granted Oct 17, 1995·46 cites·17 claims
- 0360US11251758B2Power amplifier circuit, semiconductor device, and method for manufacturing semiconductor deviceMURATA MANUFACTURING CO·Filed 2020·Granted Feb 15, 2022·0 cites·20 claims
- 0459US2024380368A1Limiter circuit and power amplifier circuitMURATA MANUFACTURING CO·Filed 2024·Application pending·0 cites
- 0555US7365845B2Optical spectrum analyzerANRITSU CORP·Filed 2006·Granted Apr 29, 2008·2 cites·11 claims
- 0655US5452785ACoin diameter discriminating apparatusANRITSU CORP·Filed 1994·Granted Sep 26, 1995·23 cites·3 claims
- 0754US4822211AMethod and apparatus for laying cable in a pipeNIPPON HUME PIPE·Filed 1987·Granted Apr 18, 1989·22 cites·3 claims
- 0853US12047043B2Power amplifier deviceMURATA MANUFACTURING CO·Filed 2021·Granted Jul 23, 2024·0 cites·9 claims
- 0953US11239187B2Semiconductor deviceMURATA MANUFACTURING CO·Filed 2020·Granted Feb 1, 2022·0 cites·20 claims
- 1050US2025204076A1Electronic circuit moduleMURATA MANUFACTURING CO·Filed 2025·Application pending·0 cites
- 1146US10338260B2Metal detection apparatus and metal detection methodANRITSU INFIVIS CO LTD·Filed 2018·Granted Jul 2, 2019·0 cites·9 claims
- 1243US10999918B2X-ray tube and X-ray generation deviceANRITSU INFIVIS CO LTD·Filed 2018·Granted May 4, 2021·0 cites·9 claims
- 1338US8198478B2Method of producing alpha-form glutamic acid crystalsNAGAI HIDETADA·Filed 2009·Granted Jun 12, 2012·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →