Inventor · disambiguated record
Yoshiaki Toyoda
Also filed as: SUZUKI TAKAAI · TOYODA YOSHIAKI
36 granted patents·4 pending applications·144 citations·filing 1976–2023
96Inventor score
Files withFUJI ELECTRIC CO LTD31MITSUI TOATSU CHEMICALS4FUJI ELECTRIC SYSTEMS CO LTD1HARADA YUICHI1KAWASAKI HEAVY IND LTD1
Top patents by PatentIndex Score
40 records- 0193US9362118B2Semiconductor device and manufacturing method thereofFUJI ELECTRIC CO LTD·Filed 2015·Granted Jun 7, 2016·8 cites·4 claims
- 0293US8847305B2Semiconductor device and manufacturing method thereofFUJI ELECTRIC CO LTD·Filed 2012·Granted Sep 30, 2014·11 cites·6 claims
- 0391US9761545B2Isolator and method of manufacturing isolatorFUJI ELECTRIC CO LTD·Filed 2016·Granted Sep 12, 2017·10 cites·18 claims
- 0490US9129892B2Semiconductor device and manufacturing method thereofFUJI ELECTRIC CO LTD·Filed 2014·Granted Sep 8, 2015·8 cites·8 claims
- 0589US9543217B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Jan 10, 2017·8 cites·5 claims
- 0687US4425255ARegeneration method of catalystsMITSUI TOATSU CHEMICALS·Filed 1981·Granted Jan 10, 1984·47 cites·12 claims
- 0783US10916624B2Semiconductor integrated circuit and method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2019·Granted Feb 9, 2021·3 cites·8 claims
- 0883US10141299B2Semiconductor device with protective element portionFUJI ELECTRIC CO LTD·Filed 2017·Granted Nov 27, 2018·3 cites·21 claims
- 0979US9318784B2Isolator and isolator manufacturing methodFUJI ELECTRIC CO LTD·Filed 2013·Granted Apr 19, 2016·5 cites·12 claims
- 1078US9209296B2Semiconductor device and method of manufacturing the sameTOYODA YOSHIAKI·Filed 2012·Granted Dec 8, 2015·6 cites·4 claims
- 1176US9502496B2Semiconductor device and method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2015·Granted Nov 22, 2016·2 cites·2 claims
- 1271US4555583APreparation process for glyoxalMITSUI TOATSU CHEMICALS·Filed 1983·Granted Nov 26, 1985·11 cites·8 claims
- 1369US9142463B2Semiconductor deviceHARADA YUICHI·Filed 2011·Granted Sep 22, 2015·3 cites·12 claims
- 1467US8835254B2Semiconductor device manufacturing methodFUJI ELECTRIC CO LTD·Filed 2013·Granted Sep 16, 2014·3 cites·8 claims
- 1566US12308148B2Semiconductor resistance deviceFUJI ELECTRIC CO LTD·Filed 2022·Granted May 20, 2025·0 cites·11 claims
- 1664US10964686B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2020·Granted Mar 30, 2021·0 cites·1 claims
- 1764US7777518B2Semiconductor integrated circuit deviceFUJI ELECTRIC SYSTEMS CO LTD·Filed 2009·Granted Aug 17, 2010·4 cites·5 claims
- 1862US11502164B2Method of manufacturing semiconductor integrated circuitFUJI ELECTRIC CO LTD·Filed 2021·Granted Nov 15, 2022·0 cites·6 claims
- 1961US9318433B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2014·Granted Apr 19, 2016·1 cites·9 claims
- 2060US11677033B2Passive element on a semiconductor base bodyFUJI ELECTRIC CO LTD·Filed 2021·Granted Jun 13, 2023·0 cites·14 claims
- 2158US10720421B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2018·Granted Jul 21, 2020·0 cites·24 claims
- 2257US11948937B2Semiconductor integrated circuit with edge structure to decrease leakage currentFUJI ELECTRIC CO LTD·Filed 2021·Granted Apr 2, 2024·0 cites·16 claims
- 2355US2023402445A1Semiconductor device and its manufacturing methodFUJI ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 2453US11923451B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2021·Granted Mar 5, 2024·0 cites·19 claims
- 2551US2023050067A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2022·Application pending·0 cites
- 2649US11145552B2Method of manufacturing semiconductor integrated circuitFUJI ELECTRIC CO LTD·Filed 2019·Granted Oct 12, 2021·0 cites·19 claims
- 2743US11164797B2Method of manufacturing semiconductor integrated circuitFUJI ELECTRIC CO LTD·Filed 2018·Granted Nov 2, 2021·0 cites·20 claims
- 2843US10418479B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2018·Granted Sep 17, 2019·0 cites·14 claims
- 2941US10580907B2Semiconductor device and semiconductor moduleFUJI ELECTRIC CO LTD·Filed 2018·Granted Mar 3, 2020·0 cites·10 claims
- 3040US9865586B2Semiconductor device and method for testing the semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Jan 9, 2018·0 cites·13 claims
- 3140US4069660AChemical reaction furnace systemKAWASAKI HEAVY IND LTD·Filed 1976·Granted Jan 24, 1978·6 cites·6 claims
- 3239US4810482AProcess for producing silanesMITSUI TOATSU CHEMICALS·Filed 1983·Granted Mar 7, 1989·5 cites·2 claims
- 3337US9880203B2Semiconductor device and method for manufacturing the semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2015·Granted Jan 30, 2018·0 cites·14 claims
- 3437US9613945B1Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Apr 4, 2017·0 cites·18 claims
- 3537US2013093053A1Trench type pip capacitor, power integrated circuit device using the capacitor, and method of manufacturing the power integrated circuit deviceFUJI ELECTRIC CO LTD·Filed 2012·Application pending·0 cites
- 3637US2018076201A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2017·Application pending·0 cites
- 3734US9705488B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2015·Granted Jul 11, 2017·0 cites·14 claims
- 3834US9419132B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2015·Granted Aug 16, 2016·0 cites·12 claims
- 3932US9013161B2Load drive circuitNISHIO MINORU·Filed 2012·Granted Apr 21, 2015·0 cites·7 claims
- 4023US4181489AProcess for the treatment of byproducts obtained in the preparation of phthalic anhydrideMITSUI TOATSU CHEMICALS·Filed 1977·Granted Jan 1, 1980·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →