Inventor · disambiguated record
Yoichi Uehara
Also filed as: UEHARA YOICHI
12 granted patents·198 citations·filing 1979–2006
91Inventor score
Files withHITACHI LTD3HONDA MOTOR CO LTD3DORYOKURO KAKUNENRYO1INC ADMIN AGENCY NARO1RENESAS TECH CORP1
Top patents by PatentIndex Score
12 records- 0188US6380778B2Semiconductor integrated circuitHITACHI LTD·Filed 2001·Granted Apr 30, 2002·43 cites·22 claims
- 0287US7158392B2Switching power supply device and the semiconductor integrated circuit for power supply controlRENESAS TECH CORP·Filed 2003·Granted Jan 2, 2007·55 cites·23 claims
- 0384US7131311B1Method of and apparatus for forming forging blankHONDA MOTOR CO LTD·Filed 2005·Granted Nov 7, 2006·12 cites·11 claims
- 0483US7191633B1Forging apparatusHONDA MOTOR CO LTD·Filed 2005·Granted Mar 20, 2007·11 cites·19 claims
- 0582US7706552B2Sound signal processing apparatus and sound signal processing methodSONY CORP·Filed 2005·Granted Apr 27, 2010·3 cites·5 claims
- 0675US8327581B2Method for producing biomineral-containing substance and organic hydroponics methodSHINOHARA MAKOTO·Filed 2006·Granted Dec 11, 2012·4 cites·16 claims
- 0771US5940416ADigital signal decoding apparatus and a decoding method used thereinHITACHI LTD·Filed 1997·Granted Aug 17, 1999·32 cites·9 claims
- 0867US7146838B1Method of and apparatus for forming tooth profileHONDA MOTOR CO LTD·Filed 2005·Granted Dec 12, 2006·3 cites·15 claims
- 0961US6373407B1Data encoding method for digital data recording and data recording system using the sameHITACHI LTD·Filed 1999·Granted Apr 16, 2002·15 cites·5 claims
- 1049US6288391B1Method for locking probe of scanning probe microscopeUNIV TOHOKU·Filed 1998·Granted Sep 11, 2001·17 cites·7 claims
- 1146US7341857B2Production of beta-hydroxypalmitate methyl esterase from Ideonella sp.0-0013 (FERM BP-08660)INC ADMIN AGENCY NARO·Filed 2004·Granted Mar 11, 2008·0 cites·3 claims
- 1226US4395810AMethod for coating a sodium piping in a fast breeder reactorDORYOKURO KAKUNENRYO·Filed 1979·Granted Aug 2, 1983·3 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →