Inventor · disambiguated record
Yoav Weizman
Also filed as: WEIZMAN YOAV
12 granted patents·2 pending applications·17 citations·filing 2003–2019
85Inventor score
Files withUNIV BAR ILAN5WEIZMAN YOAV4BIRAD—RESEARCH & DEV COMPANY LTD2FREESCALE SEMICONDUCTOR INC2ROZEN ANTON1
Top patents by PatentIndex Score
14 records- 0178US11586778B2Secured memoryUNIV BAR ILAN·Filed 2018·Granted Feb 21, 2023·3 cites·25 claims
- 0275US10811073B2Dynamic memory physical unclonable functionBIRAD—RESEARCH & DEV COMPANY LTD·Filed 2019·Granted Oct 20, 2020·2 cites·8 claims
- 0369US9671456B2Semiconductor device arrangement, a method of analysing a performance of a functional circuit on a semiconductor device and a device analysis systemWEIZMAN YOAV·Filed 2012·Granted Jun 6, 2017·4 cites·14 claims
- 0467US10999083B2Detecting unreliable bits in transistor circuitryBIRAD—RESEARCH & DEV COMPANY LTD·Filed 2019·Granted May 4, 2021·1 cites·16 claims
- 0566US10630493B2Physical unclonable functions related to inverter trip pointsUNIV BAR ILAN·Filed 2017·Granted Apr 21, 2020·1 cites·11 claims
- 0652US8134384B2Method for testing noise immunity of an integrated circuit and a device having noise immunity testing capabilitiesWEIZMAN YOAV·Filed 2006·Granted Mar 13, 2012·2 cites·20 claims
- 0749US8368383B2Method for testing a variable digital delay line and a device having variable digital delay line testing capabilitiesFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Feb 5, 2013·2 cites·20 claims
- 0847US11321460B2Information redistribution to reduce side channel leakageUNIV BAR ILAN·Filed 2019·Granted May 3, 2022·0 cites·18 claims
- 0946US7151387B2Analysis module, integrated circuit, system and method for testing an integrated circuitFREESCALE SEMICONDUCTOR INC·Filed 2003·Granted Dec 19, 2006·2 cites·18 claims
- 1045US9606064B2Method of detecting irregular current flow in an integrated circuit device and apparatus thereforROZEN ANTON·Filed 2012·Granted Mar 28, 2017·0 cites·15 claims
- 1143US8430562B2Device and method for evaluating a temperatureWEIZMAN YOAV·Filed 2011·Granted Apr 30, 2013·0 cites·20 claims
- 1241US8070357B2Device and method for evaluating a temperatureWEIZMAN YOAV·Filed 2008·Granted Dec 6, 2011·0 cites·20 claims
- 1335US2019187957A1Compact bit generatorUNIV BAR ILAN·Filed 2018·Application pending·0 cites
- 1433US2019074984A1Detecting unreliable bits in transistor circuitryUNIV BAR ILAN·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →