Inventor · disambiguated record
Yoshito Yoneyama
Also filed as: YONEYAMA YOSHITO
13 granted patents·1 pending application·1,212 citations·filing 1990–2006
95Inventor score
Files withCANON KK14
Top patents by PatentIndex Score
14 records- 0196US5275787AApparatus for separating or measuring particles to be examined in a sample fluidCANON KK·Filed 1992·Granted Jan 4, 1994·257 cites·6 claims
- 0296US5180065AApparatus for and method of fractionating particle in particle-suspended liquid in conformity with the properties thereofCANON KK·Filed 1990·Granted Jan 19, 1993·183 cites·16 claims
- 0395US6385497B1Remote maintenance systemCANON KK·Filed 1997·Granted May 7, 2002·195 cites·82 claims
- 0493US5182617ASample supply device and sample inspection apparatus using the deviceCANON KK·Filed 1990·Granted Jan 26, 1993·129 cites·32 claims
- 0592US7062343B2Remote maintenance systemCANON KK·Filed 2005·Granted Jun 13, 2006·37 cites·13 claims
- 0692US5370842ASample measuring device and sample measuring systemCANON KK·Filed 1992·Granted Dec 6, 1994·198 cites·17 claims
- 0786US6801913B2Medical instrument control systemCANON KK·Filed 2001·Granted Oct 5, 2004·33 cites·43 claims
- 0883US6963786B2Remote maintenance systemCANON KK·Filed 2001·Granted Nov 8, 2005·23 cites·64 claims
- 0983US6892109B2Remote maintenance systemCANON KK·Filed 2001·Granted May 10, 2005·23 cites·10 claims
- 1083US5599502ALiquid moving apparatus and measuring apparatus utilizing the sameCANON KK·Filed 1994·Granted Feb 4, 1997·46 cites·8 claims
- 1180US7805279B2Remote maintenance systemCANON KK·Filed 2006·Granted Sep 28, 2010·10 cites·11 claims
- 1276US5871587AProcessing system for semiconductor device manufacture of otherwiseCANON KK·Filed 1996·Granted Feb 16, 1999·46 cites·11 claims
- 1366US5828572AProcessing System and semiconductor device production method using the same including air conditioning control in operational zonesCANON KK·Filed 1996·Granted Oct 27, 1998·32 cites·28 claims
- 1465US2004249729A1Medical instrument control systemCANON KK·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →