Inventor · disambiguated record
Yuanping Chen
Also filed as: CHEN YUANPING
9 granted patents·1 pending application·112 citations·filing 2001–2024
86Inventor score
Files withPARADE TECH LTD2EPIR LTD1EPIR TECHNOLOGIES INC1GANZHOU XINGHAO ELECTRONIC TECH CO LTD1PARADE TECHNOLOGIES LTD1
Top patents by PatentIndex Score
10 records- 0193US7487379B2High performance integrated circuit with low skew clocking networks and improved low power operating mode having reduced recovery timeRMI CORP·Filed 2005·Granted Feb 3, 2009·39 cites·18 claims
- 0281US6657194B2Multispectral monolithic infrared focal plane array detectorsEPIR TECHNOLOGIES INC·Filed 2001·Granted Dec 2, 2003·40 cites·11 claims
- 0375US11110513B2Combined ultrasonic micro-forging device for improving microstructure and mechanical properties of additive manufactured metal parts, and a related additive manufacturing methodUNIV HARBIN ENG·Filed 2017·Granted Sep 7, 2021·2 cites·7 claims
- 0475US7518207B1Molecular beam epitaxy growth of ternary and quaternary metal chalcogenide filmsUS NAVY·Filed 2004·Granted Apr 14, 2009·26 cites·13 claims
- 0565US8923375B2On die jitter tolerance testQU MING·Filed 2012·Granted Dec 30, 2014·2 cites·17 claims
- 0664USD1038821SChristmas treeGANZHOU XINGHAO ELECTRONIC TECH CO LTD·Filed 2024·Granted Aug 13, 2024·3 cites·1 claims
- 0759US12449878B2Exiting of low power modes of redrivers and retimersPARADE TECH LTD·Filed 2023·Granted Oct 21, 2025·0 cites·20 claims
- 0857US12235781B2Power consumption control for transmitters of retimers in high speed data communicationPARADE TECH LTD·Filed 2022·Granted Feb 25, 2025·0 cites·20 claims
- 0956US9209818B2On die jitter tolerance testPARADE TECHNOLOGIES LTD·Filed 2014·Granted Dec 8, 2015·0 cites·21 claims
- 1029US2003102432A1Monolithic infrared focal plane array detectorsEPIR LTD·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →