Inventor · disambiguated record
Yung-Min Cheng
Also filed as: CHENG YUNG-MIN
3 granted patents·21 citations·filing 2001–2002
66Inventor score
Files withTAIWAN SEMICONDUCTOR MFG3
Top patents by PatentIndex Score
3 records- 0166US6590408B1Microelectronic fabrication electrical test apparatus and method providing enhanced electrical test accuracyTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Jul 8, 2003·15 cites·10 claims
- 0250US6724211B2System for validating and monitoring semiconductor testing toolsTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Apr 20, 2004·4 cites·32 claims
- 0340US6787375B2Microelectronic fabrication die electrical test method providing enhanced microelectronic fabrication die electrical test efficiencyTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Sep 7, 2004·2 cites·11 claims
Join the waitlist — get patent alerts
Get an alert when Yung-Min Cheng files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →