Inventor · disambiguated record
Yusuke Hida
Also filed as: HIDA YUSUKE
8 granted patents·3 pending applications·11 citations·filing 2017–2024
77Inventor score
Top patents by PatentIndex Score
11 records- 0188US11727670B2Defect detection method and apparatusFUJITSU LTD·Filed 2021·Granted Aug 15, 2023·3 cites·15 claims
- 0286US12100199B2Apparatus, program, and method for anomaly detection and classificationFUJITSU LTD·Filed 2021·Granted Sep 24, 2024·2 cites·20 claims
- 0380US11302039B2Waveform analyzerSHIMADZU CORP·Filed 2017·Granted Apr 12, 2022·5 cites·15 claims
- 0475US11486866B2Waveform analyzerSHIMADZU CORP·Filed 2017·Granted Nov 1, 2022·1 cites·10 claims
- 0561US12111851B1Dynamic classification of time-series categorical dataFUJITSU LTD·Filed 2023·Granted Oct 8, 2024·0 cites·20 claims
- 0657US2025285359A1Dynamic multi-dimensional media content projectionFUJITSU LTD·Filed 2024·Application pending·0 cites
- 0752US11176455B2Learning data generation apparatus and learning data generation methodFUJITSU LTD·Filed 2019·Granted Nov 16, 2021·0 cites·11 claims
- 0848US12072323B2Analyzer configured to display list of target componentsSHIMADZU CORP·Filed 2019·Granted Aug 27, 2024·0 cites·14 claims
- 0948US2020284640A1Recording medium recording measurement control program, measurement control method and information processing deviceFUJITSU LTD·Filed 2020·Application pending·0 cites
- 1042US11263258B2Information processing method, information processing apparatus, and non-transitory computer-readable storage medium for storing information processing program of scoring with respect to combination of imaging method and trained modelFUJITSU LTD·Filed 2020·Granted Mar 1, 2022·0 cites·13 claims
- 1142US2020193329A1Learning method and learning apparatusFUJITSU LTD·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →