Inventor · disambiguated record
Yukinori Hirose
Also filed as: HIROSE YUKINORI
5 granted patents·1 pending application·86 citations·filing 1996–2014
77Inventor score
Top patents by PatentIndex Score
6 records- 0182US6452174B1Charged particle beam apparatus and method of controlling sameMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 17, 2002·33 cites·17 claims
- 0274US5780870ASemiconductor device and a process of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jul 14, 1998·51 cites·15 claims
- 0354US6826971B2Fabrication method for sample to be analyzedRENESAS TECH CORP·Filed 2002·Granted Dec 7, 2004·2 cites·7 claims
- 0453US9362184B2Semiconductor device, manufacturing method of semiconductor device, semiconductor manufacturing and inspecting apparatus, and inspecting apparatusRENESAS ELECTRONICS CORP·Filed 2014·Granted Jun 7, 2016·0 cites·12 claims
- 0544US8946895B2Semiconductor device, manufacturing method of semiconductor device, semiconductor manufacturing and inspecting apparatus, and inspecting apparatusKATO TAKAHIKO·Filed 2009·Granted Feb 3, 2015·0 cites·2 claims
- 0635US2004188610A1Crystal analyzing apparatus capable of three-dimensional crystal analysisRENESAS TECH CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →