Inventor · disambiguated record
Yun Seok Hong
Also filed as: HONG YUN SEOK
34 granted patents·3 pending applications·82 citations·filing 2004–2021
95Inventor score
Top patents by PatentIndex Score
37 records- 0192US9236859B1Power control deviceSK HYNIX INC·Filed 2014·Granted Jan 12, 2016·11 cites·20 claims
- 0291US8896354B1Driving deviceSK HYNIX INC·Filed 2013·Granted Nov 25, 2014·11 cites·21 claims
- 0388US11188109B1Devices configured to conduct a power gating operationSK HYNIX INC·Filed 2021·Granted Nov 30, 2021·2 cites·24 claims
- 0480US10388561B2Semiconductor integrated circuit device having electrostatic discharge protection circuitSK HYNIX INC·Filed 2017·Granted Aug 20, 2019·3 cites·7 claims
- 0579US9466391B2Semiconductor device having fuse array with disconnectable voltage generator and method of operating the sameSK HYNIX INC·Filed 2014·Granted Oct 11, 2016·6 cites·20 claims
- 0677US9568934B2Semiconductor device and semiconductor system including the sameSK HYNIX INC·Filed 2015·Granted Feb 14, 2017·3 cites·22 claims
- 0768US7859931B2Refresh period signal generator with digital temperature information generation functionHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Dec 28, 2010·6 cites·41 claims
- 0867US7705688B2Period signal generator of semiconductor integrated circuitHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Apr 27, 2010·6 cites·19 claims
- 0966US10141298B2Semiconductor integrated circuit device relating to an electrical over stress protecting circuitSK HYNIX INC·Filed 2016·Granted Nov 27, 2018·1 cites·10 claims
- 1064US9430032B2Driver circuit of semiconductor apparatusSK HYNIX INC·Filed 2013·Granted Aug 30, 2016·1 cites·17 claims
- 1162US11599131B2Electronic device performing power switching operationSK HYNIX INC·Filed 2021·Granted Mar 7, 2023·0 cites·20 claims
- 1261US8547145B2Power-up signal generation circuit of semiconductor apparatusHONG YUN SEOK·Filed 2011·Granted Oct 1, 2013·1 cites·16 claims
- 1360US7193925B2Low power semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Mar 20, 2007·11 cites·11 claims
- 1459US9502966B2Pumping circuitSK HYNIX INC·Filed 2013·Granted Nov 22, 2016·1 cites·12 claims
- 1559US7313039B2Method for analyzing defect of SRAM cellHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Dec 25, 2007·3 cites·8 claims
- 1658US11049558B2Semiconductor system including a phase changeable memory deviceSK HYNIX INC·Filed 2020·Granted Jun 29, 2021·0 cites·9 claims
- 1756US11327112B2Semiconductor device for detecting characteristics of semiconductor element and operating method thereofSK HYNIX INC·Filed 2021·Granted May 10, 2022·0 cites·21 claims
- 1854US11575375B2Electronic device performing power gating operationSK HYNIX INC·Filed 2021·Granted Feb 7, 2023·0 cites·19 claims
- 1954US8220992B2Digital temperature information generating apparatus for semiconductor integrated circuitHONG YUN-SEOK·Filed 2008·Granted Jul 17, 2012·3 cites·20 claims
- 2050US9430247B2Boot-up method of E-fuse, semiconductor device and semiconductor system including the sameSK HYNIX INC·Filed 2013·Granted Aug 30, 2016·0 cites·16 claims
- 2149US9557788B2Semiconductor memory device including array e-fuseSK HYNIX INC·Filed 2013·Granted Jan 31, 2017·0 cites·14 claims
- 2249US7471136B2Temperature compensated self-refresh circuitHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Dec 30, 2008·2 cites·5 claims
- 2348US7126865B2Memory device including parallel test circuitHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Oct 24, 2006·5 cites·5 claims
- 2445US9577636B1Substate bias voltage generation circuits and methods to control leakage in semiconductor memory deviceSK HYNIX INC·Filed 2016·Granted Feb 21, 2017·0 cites·25 claims
- 2544US8026752B2Delay circuitHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Sep 27, 2011·0 cites·13 claims
- 2643US10607697B2Semiconductor system including a phase changeable memory deviceSK HYNIX INC·Filed 2017·Granted Mar 31, 2020·0 cites·10 claims
- 2743US9543827B2Internal voltage generation circuitsSK HYNIX INC·Filed 2015·Granted Jan 10, 2017·0 cites·26 claims
- 2842US8432179B2Test device for testing transistor characteristics in semiconductor integrated circuitHONG YUN SEOK·Filed 2010·Granted Apr 30, 2013·0 cites·11 claims
- 2942US2015029624A1Protection circuit and protection apparatus including the sameSK HYNIX INC·Filed 2014·Application pending·0 cites
- 3041US10607666B2Data transfer device and semiconductor device including the data transfer deviceSK HYNIX INC·Filed 2018·Granted Mar 31, 2020·0 cites·20 claims
- 3141US9922708B1Voltage controlling circuitSK HYNIX INC·Filed 2017·Granted Mar 20, 2018·0 cites·18 claims
- 3241US7095663B2Method for analyzing defect of SRAM cellHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Aug 22, 2006·2 cites·11 claims
- 3340US7835216B2Semiconductor memory apparatus having decreased leakage currentHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Nov 16, 2010·0 cites·12 claims
- 3440US7145826B2Device for controlling temperature compensated self-refresh periodHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Dec 5, 2006·4 cites·9 claims
- 3538US8441864B2Self refresh circuitHONG YUN SEOK·Filed 2011·Granted May 14, 2013·0 cites·39 claims
- 3636US2014145766A1Initialization circuitSK HYNIX INC·Filed 2013·Application pending·0 cites
- 3733US2013169354A1Internal voltage generation circuitHONG YUN SEOK·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →