Inventor · disambiguated record
Yuki Hosoe
Also filed as: HOSOE YUKI
8 granted patents·3 pending applications·51 citations·filing 2006–2023
81Inventor score
Top patents by PatentIndex Score
11 records- 0192US7755366B2Calibration circuit, semiconductor device including the same, and method of adjusting output characteristics of semiconductor deviceELPIDA MEMORY INC·Filed 2007·Granted Jul 13, 2010·28 cites·19 claims
- 0281US7688671B2Semiconductor memory chip with on-die termination functionELPIDA MEMORY INC·Filed 2006·Granted Mar 30, 2010·14 cites·18 claims
- 0379US8902687B2Semiconductor device enabling refreshing of redundant memory cell instead of defective memory cellHOSOE YUKI·Filed 2011·Granted Dec 2, 2014·8 cites·14 claims
- 0450US2023294427A1Conveying deviceRISO KAGAKU CORP·Filed 2023·Application pending·0 cites
- 0543US9269458B2Semiconductor device enabling refreshing of redundant memory cell instead of defective memory cellPS4 LUXCO SARL·Filed 2014·Granted Feb 23, 2016·0 cites·9 claims
- 0640US8477520B2Semiconductor memory deviceHOSOE YUKI·Filed 2010·Granted Jul 2, 2013·1 cites·9 claims
- 0736US10658052B2Semiconductor deviceWINBOND ELECTRONICS CORP·Filed 2019·Granted May 19, 2020·0 cites·9 claims
- 0836US8976617B2Semiconductor device having plural selection lines selected based on address signalELPIDA MEMORY INC·Filed 2012·Granted Mar 10, 2015·0 cites·5 claims
- 0936US7868684B2Semiconductor device whose internal power supply voltage is generated by voltage step-up circuitELPIDA MEMORY INC·Filed 2009·Granted Jan 11, 2011·0 cites·16 claims
- 1035US2010142302A1Semiconductor memory device and testing method thereforELPIDA MEMORY INC·Filed 2009·Application pending·0 cites
- 1135US2010103749A1Semiconductor memory deviceELPIDA MEMORY INC·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →