Inventor · disambiguated record
Yun Taek Hwang
Also filed as: HWANG YUN-TAEK
9 granted patents·4 pending applications·24 citations·filing 2008–2013
83Inventor score
Top patents by PatentIndex Score
13 records- 0177US8345463B2Resistive memory device and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Jan 1, 2013·8 cites·14 claims
- 0275US8513635B2Switching device and memory device including the sameHWANG YUN-TAEK·Filed 2010·Granted Aug 20, 2013·3 cites·21 claims
- 0367US7800197B2Semiconductor device and method of fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Sep 21, 2010·4 cites·18 claims
- 0458US8847188B2Switching device and memory device including the sameSK HYNIX INC·Filed 2013·Granted Sep 30, 2014·0 cites·20 claims
- 0558US8324070B2Semiconductor device and method for manufacturing the sameHWANG YUN TAEK·Filed 2008·Granted Dec 4, 2012·2 cites·14 claims
- 0658US8274102B2Semiconductor deviceHWANG YUN TAEK·Filed 2010·Granted Sep 25, 2012·1 cites·12 claims
- 0757US8148708B2Resistive memory device and method of fabricating the sameHWANG YUN-TAEK·Filed 2008·Granted Apr 3, 2012·5 cites·18 claims
- 0856US7824971B2Semiconductor device and method for manufacturing the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Nov 2, 2010·1 cites·9 claims
- 0951US2009218635A1Semiconductor Device and Method for Manufacturing the SameHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 1046US8697563B2Method for forming semiconductor device having multiple active layer structureHWANG YUN TAEK·Filed 2011·Granted Apr 15, 2014·0 cites·9 claims
- 1144US2013026435A1Switching device and resistance change memory device using the sameYI JAE-YUN·Filed 2011·Application pending·0 cites
- 1242US2010163819A1Resistive memory device and method for fabricating the sameHWANG YUN-TAEK·Filed 2009·Application pending·0 cites
- 1341US2009302301A1Resistance ram device having a carbon nano-tube and method for manufacturing the sameHWANG YUN TAEK·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →