Inventor · disambiguated record
Yuuichiro Iijima
Also filed as: IIJIMA YUUICHIRO
2 granted patents·1 pending application·0 citations·filing 2007–2012
36Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0151US2007211241A1Optical defect inspection apparatusAIZAWA NORIYUKI·Filed 2007·Application pending·0 cites
- 0247US8472016B2Optical defect inspection apparatusIIJIMA YUUICHIRO·Filed 2012·Granted Jun 25, 2013·0 cites·18 claims
- 0344US8184283B2Optical defect inspection apparatusIIJIMA YUUICHIRO·Filed 2010·Granted May 22, 2012·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →