Inventor · disambiguated record
Yukio Imada
Also filed as: IMADA YUKIO
3 granted patents·61 citations·filing 1997–2002
70Inventor score
Technology areasG01B
Top patents by PatentIndex Score
3 records- 0184US6480286B1Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatusMATSUSHITA ELECTRIC INUDSTRIAL·Filed 2000·Granted Nov 12, 2002·39 cites·11 claims
- 0257US6026583AShape measuring apparatus and methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Feb 22, 2000·21 cites·17 claims
- 0339US6934036B2Configuration measuring apparatus and methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Aug 23, 2005·1 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →