Inventor · disambiguated record
Yuudai Ishikawa
Also filed as: ISHIKAWA YUUDAI
1 granted patent·2 pending applications·8 citations·filing 2005–2010
30Inventor score
Top patents by PatentIndex Score
3 records- 0175US7355691B2Defect inspection apparatus and defect inspection methodHOYA CORP·Filed 2006·Granted Apr 8, 2008·8 cites·16 claims
- 0247US2005220330A1Method of inspecting an mura defect in a pattern and apparatus used for the sameHOYA CORP·Filed 2005·Application pending·0 cites
- 0328US2011128850A1Band control system, load distribution device and band control deviceIIZAWA RYO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →