Inventor · disambiguated record
Yuzuru Iwai
Also filed as: IWAI YUZURU
10 granted patents·1 pending application·175 citations·filing 1991–2008
90Inventor score
Top patents by PatentIndex Score
11 records- 0191US8514524B2Stabilized shields for magnetic recording headsWU YAN·Filed 2008·Granted Aug 20, 2013·14 cites·23 claims
- 0291US6487041B2Thin film magnetic head with interlayers of multi-layer poles widening to a constant width portion at a receded distanceTDK CORP·Filed 2001·Granted Nov 26, 2002·30 cites·4 claims
- 0386US5721488AMethod and apparatus for testing integrated magnetic head assemblyTDK CORP·Filed 1996·Granted Feb 24, 1998·60 cites·8 claims
- 0478US6252748B1Thin film magnetic head with widening outer layer of multi-layer poleTDK CORP·Filed 1998·Granted Jun 26, 2001·27 cites·5 claims
- 0556US6426853B1Magnetoresistive effect sensor, thin-film magnetic head and thin-film wafer with the thin-film magnetic headsTDK CORP·Filed 1999·Granted Jul 30, 2002·19 cites·13 claims
- 0654US6144533AThin film magnetic headTDK CORP·Filed 1998·Granted Nov 7, 2000·11 cites·4 claims
- 0748US7027271B2Magnetoresistive device in a thin-film magnetic head and method of manufacturing same having particular electrode overlay configurationTDK CORP·Filed 2001·Granted Apr 11, 2006·4 cites·12 claims
- 0840US5768065AThin film magnetic headTDK CORP·Filed 1994·Granted Jun 16, 1998·4 cites·5 claims
- 0939US6317291B1Thin-film magnetic head having improved data writing characteristics and a method of making the sameTDK CORP·Filed 1999·Granted Nov 13, 2001·4 cites·2 claims
- 1038US2002036874A1Magnetoresistive device and method of manufacturing same and thin-film magnetic head and method of manufacturing sameTDK CORP·Filed 2001·Application pending·0 cites
- 1131US5236735AMethod of producing a thin film magnetic headTDK CORP·Filed 1991·Granted Aug 17, 1993·2 cites·7 claims
Join the waitlist — get patent alerts
Get an alert when Yuzuru Iwai files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →