Inventor · disambiguated record
Yunjung Jee
Also filed as: JEE YUNJUNG
2 granted patents·0 citations·filing 2017–2017
22Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0140US10269111B2Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Apr 23, 2019·0 cites·19 claims
- 0236US10088297B2Apparatus and method for measuring thicknessSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 2, 2018·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →