Inventor · disambiguated record
Yukihiro Kagawa
Also filed as: KAGAWA YUKIHIRO
2 granted patents·0 citations·filing 2021–2021
21Inventor score
Technology areasG01N
Files withVIENEX CORP2
Top patents by PatentIndex Score
2 records- 0147US12292386B2Foreign substance/defect inspection device, image generation device in foreign substance/defect inspection, and foreign substance/defect inspection methodVIENEX CORP·Filed 2021·Granted May 6, 2025·0 cites·18 claims
- 0247US12209971B2Foreign substance/defect inspection device, image generation device in foreign substance/defect inspection, and foreign substance/defect inspection methodVIENEX CORP·Filed 2021·Granted Jan 28, 2025·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →