Inventor · disambiguated record
Yuko Kariya
Also filed as: KARIYA YUKO
1 granted patent·2 pending applications·4 citations·filing 2006–2011
26Inventor score
Top patents by PatentIndex Score
3 records- 0174US8209135B2Wafer inspection data handling and defect review toolFUNAKOSHI TOMOHIRO·Filed 2011·Granted Jun 26, 2012·4 cites·10 claims
- 0250US2007105245A1Wafer inspection data handling and defect review toolHITACHI HIGH TECH CORP·Filed 2006·Application pending·0 cites
- 0326US2013055038A1Computing unit abnormality determining apparatus and methodNAKAMURA MUNENORI·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →