Inventor · disambiguated record
Yuji Kasai
Also filed as: KASAI YUJI
30 granted patents·10 pending applications·689 citations·filing 1988–2022
96Inventor score
Files withHARMOTEC CO LTD10NAT INST OF ADVANCED IND SCIEN6AGENCY IND SCIENCE TECHN4HITACHI HIGH TECH CORP4HITACHI LTD3
Top patents by PatentIndex Score
40 records- 0198US6583413B1Method of inspecting a circuit pattern and inspecting instrumentHITACHI LTD·Filed 2000·Granted Jun 24, 2003·123 cites·14 claims
- 0296US6844739B2Maximum power point tracking method and deviceNAT INST OF ADVANCED IND SCIEN·Filed 2002·Granted Jan 18, 2005·383 cites·8 claims
- 0390US7397031B2Method of inspecting a circuit pattern and inspecting instrumentHITACHI LTD·Filed 2006·Granted Jul 8, 2008·10 cites·7 claims
- 0488US8890068B2Charged particle ray apparatus and pattern measurement methodKASAI YUJI·Filed 2012·Granted Nov 18, 2014·9 cites·14 claims
- 0587US7098455B2Method of inspecting a circuit pattern and inspecting instrumentHITACHI LTD·Filed 2003·Granted Aug 29, 2006·26 cites·5 claims
- 0684US10643881B2Baffle plateHARMOTEC CO LTD·Filed 2017·Granted May 5, 2020·5 cites·9 claims
- 0783US10189166B2Suction equipmentHARMOTEC CO LTD·Filed 2016·Granted Jan 29, 2019·4 cites·8 claims
- 0883US6781682B1Optical apparatus, optical apparatus adjustment method, and storage medium recorded with a processing program that executes said adjustment methodAGENCY IND SCIENCE TECHN·Filed 2000·Granted Aug 24, 2004·25 cites·14 claims
- 0981US11008180B2Swirl flow-forming body and suction deviceHARMOTEC CO LTD·Filed 2017·Granted May 18, 2021·4 cites·11 claims
- 1077US10654654B2Suction deviceHARMOTEC CO LTD·Filed 2016·Granted May 19, 2020·3 cites·9 claims
- 1177US6637008B1Electronic holding circuit and adjusting method thereof using a probabilistic searching techniqueAGENCY IND SCIENCE TECHN·Filed 1999·Granted Oct 21, 2003·32 cites·30 claims
- 1270US7529528B2Power consumption controlling apparatus for high frequency amplifierSHARP KK·Filed 2005·Granted May 5, 2009·7 cites·10 claims
- 1366US6879388B2Optical apparatus, optical apparatus adjustment method, and storage medium recorded with a processing program that executes said adjustment methodAGENCY IND SCIENCE TECHN·Filed 2004·Granted Apr 12, 2005·8 cites·18 claims
- 1466US6861848B2Capacitance position sensor and position controller equipped with the sensorNAT INST OF ADVANCED IND SCIEN·Filed 2002·Granted Mar 1, 2005·11 cites·17 claims
- 1563US9368319B2Method for removing foreign substances in charged particle beam device, and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 14, 2016·1 cites·11 claims
- 1663US7514683B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 7, 2009·1 cites·3 claims
- 1759US8686380B2Charged particle beam apparatusKATAGIRI SOUICHI·Filed 2009·Granted Apr 1, 2014·1 cites·17 claims
- 1859US7447289B2Signal timing adjustment device, signal timing adjustment system, signal timing adjustment amount setting program, and storage medium storing the programSHARP KK·Filed 2004·Granted Nov 4, 2008·10 cites·8 claims
- 1958US7248095B2Bus driver with well voltage control sectionSHARP KK·Filed 2005·Granted Jul 24, 2007·3 cites·7 claims
- 2056US7583749B2Digital data transmitting apparatusNAT INST OF ADVANCED IND SCIEN·Filed 2004·Granted Sep 1, 2009·3 cites·5 claims
- 2156US2024230392A1Measurement device, measurement system and methodJAPAN INFRASTRUCTURE MEASUREMENT INC·Filed 2022·Application pending·0 cites
- 2254US12211668B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Jan 28, 2025·0 cites·16 claims
- 2353US2015222227A1Monitoring system and slave device for photovoltaic power generation plantHITACHI INDUSTRY & CONTROL SOLUTIONS LTD·Filed 2014·Application pending·0 cites
- 2449US7295032B2High-speed signal transmission systemNAT INST OF ADVANCED IND SCIEN·Filed 2003·Granted Nov 13, 2007·3 cites·10 claims
- 2547US8493991B2Serial bus transmission systemKASAI YUJI·Filed 2009·Granted Jul 23, 2013·0 cites·8 claims
- 2645US2024109734A1Conveyance equipment, discharge fluid rectification cover, and skirtHARMOTEC CO LTD·Filed 2022·Application pending·0 cites
- 2744US7274238B2Digital circuit having delay circuit for adjustment of clock signal timingNAT INST OF ADVANCED IND SCIEN·Filed 2003·Granted Sep 25, 2007·3 cites·3 claims
- 2844US6441394B2Intrinsic Josephson superconducting tunnel junction deviceNAT INST OF ADVANCED IND SCIEN·Filed 2000·Granted Aug 27, 2002·5 cites·23 claims
- 2944US2006236146A1Digital system, clock signal adjusting method for digital system, recording medium recording processing program executed in the adjusting methodNAT INST OF ADV IND SCIENCE AN·Filed 2004·Application pending·0 cites
- 3043US10217604B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Feb 26, 2019·0 cites·15 claims
- 3143US2016300750A1Holding equipmentHARMOTEC CO LTD·Filed 2014·Application pending·0 cites
- 3243US2016300748A1Conveyance equipmentHARMOTEC CO LTD·Filed 2014·Application pending·0 cites
- 3343US2023191620A1Conveyance deviceHARMOTEC CO LTD·Filed 2021·Application pending·0 cites
- 3443US2016300749A1Holding equipment, holding system, control method, and conveyance equipmentHARMOTEC CO LTD·Filed 2014·Application pending·0 cites
- 3542US11642794B2Suction deviceHARMOTEC CO LTD·Filed 2018·Granted May 9, 2023·0 cites·8 claims
- 3640US2008310492A1Parameter Adjustment Device and Parameter Adjustment MethodEVOLVABLE SYSTEMS RES INST INC·Filed 2005·Application pending·0 cites
- 3740US2014341235A1Multiple access communication system and photovoltaic power generation systemHITACHI INDUSTRY & CONTROL SOLUTIONS LTD·Filed 2013·Application pending·0 cites
- 3837US8982926B2Spectrum spread communication systemKASAI YUJI·Filed 2011·Granted Mar 17, 2015·0 cites·6 claims
- 3936US5886778AMethod of measuring atomic beam flux rate in film growth apparatusAGENCY IND SCIENCE TECHN·Filed 1997·Granted Mar 23, 1999·4 cites·3 claims
- 4031US4957196ACoin-operated lockerKOKUSAN KINZOKU KOGYO KK·Filed 1988·Granted Sep 18, 1990·5 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →