Inventor · disambiguated record
Yukio Kishi
Also filed as: KISHI YUKIO
9 granted patents·4 pending applications·43 citations·filing 1992–2008
86Inventor score
Top patents by PatentIndex Score
13 records- 0191US8124240B2Protective film structure of metal member, metal component employing protective film structure, and equipment for producing semiconductor or flat-plate display employing protective film structureOHMI TADAHIRO·Filed 2006·Granted Feb 28, 2012·10 cites·10 claims
- 0256US6651293B2Apparatus for processing a pavement surface utilizing pressurized waterSAKAI JUKOGYO KK·Filed 2001·Granted Nov 25, 2003·3 cites·14 claims
- 0353US9238703B2Curable composition, cured product and laminateSAITO MASATO·Filed 2008·Granted Jan 19, 2016·1 cites·10 claims
- 0447US2009133713A1Multilayer structural body and method for cleaning the sameNIHON CERATEC CO LTD·Filed 2006·Application pending·0 cites
- 0543US2010040871A1Hard coat film and layered materialKIMOTO KK·Filed 2008·Application pending·0 cites
- 0642US2009169854A1Porous MemberOHMI TADAHIRO·Filed 2007·Application pending·0 cites
- 0737US5731251AOxide ceramic sintered bodiesNIHON CEMENT·Filed 1996·Granted Mar 24, 1998·5 cites·7 claims
- 0834US6631062B1Electrically conductive ceramic material, a process of producing same, and an electrostatic chuckNIHON CERATEC CO LTD·Filed 1999·Granted Oct 7, 2003·9 cites·30 claims
- 0933US5665663AMethod for manufacturing oxide ceramic sintered bodiesNIHON CEMENT·Filed 1995·Granted Sep 9, 1997·4 cites·5 claims
- 1031US5834106ACeramic substrate and producing process thereof, and a suction carrier for wafers using a ceramic wafer-chucking substrateNIHON CEMENT·Filed 1993·Granted Nov 10, 1998·9 cites·4 claims
- 1129US5492872ACeramic mirrors and method of manufacturing sameNIHON CEMENT·Filed 1992·Granted Feb 20, 1996·2 cites·7 claims
- 1229US2003071037A1Microwave sintering furnace and microwave sintering methodFiled 2002·Application pending·0 cites
- 1327US5650366ACeramic mirrorsNIHON CEMENT·Filed 1996·Granted Jul 22, 1997·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →