Inventor · disambiguated record
Yuji Kohno
Also filed as: KOHNO YUJI
18 granted patents·3 pending applications·13 citations·filing 1991–2024
88Inventor score
Top patents by PatentIndex Score
21 records- 0180US10014153B2Electron microscope and method of aberration measurementJEOL LTD·Filed 2017·Granted Jul 3, 2018·3 cites·9 claims
- 0278US10714308B2Measurement method and electron microscopeJEOL LTD·Filed 2018·Granted Jul 14, 2020·2 cites·9 claims
- 0378US10224173B2Objective lens and transmission electron microscopeJEOL LTD·Filed 2017·Granted Mar 5, 2019·3 cites·14 claims
- 0464US2025132118A1Charged Particle Gun and Charged Particle Beam SystemJEOL LTD·Filed 2024·Application pending·0 cites
- 0561US11508550B2Method and apparatus for image processingJEOL LTD·Filed 2021·Granted Nov 22, 2022·0 cites·10 claims
- 0661US2023349839A1Electron Microscope and Aberration Measurement MethodJEOL LTD·Filed 2023·Application pending·0 cites
- 0758US11456151B2Image acquisition method and electron microscopeJEOL LTD·Filed 2021·Granted Sep 27, 2022·0 cites·10 claims
- 0858US2024145211A1Method of Adjusting Charged Particle Optical System and Charged Particle Beam ApparatusJEOL LTD·Filed 2023·Application pending·0 cites
- 0956US11031208B2Cold cathode field-emission electron gun, adjustment method for cold cathode field-emission electron gun, sharpening method for emitter, and electron microscopeJEOL LTD·Filed 2018·Granted Jun 8, 2021·0 cites·11 claims
- 1051US10886099B2Method of aberration measurement and electron microscopeJEOL LTD·Filed 2019·Granted Jan 5, 2021·0 cites·7 claims
- 1150US11462384B2Method of acquiring dark-field imageJEOL LTD·Filed 2020·Granted Oct 4, 2022·0 cites·3 claims
- 1247US10840058B2Aberration measurement method and electron microscopeJEOL LTD·Filed 2018·Granted Nov 17, 2020·0 cites·13 claims
- 1347US9728372B2Measurement method and electron microscopeJEOL LTD·Filed 2016·Granted Aug 8, 2017·0 cites·10 claims
- 1446US11251016B2Method of controlling transmission electron microscope and transmission electron microscopeJEOL LTD·Filed 2020·Granted Feb 15, 2022·0 cites·7 claims
- 1546US9779911B2Electron microscope and method of measuring aberrationsJEOL LTD·Filed 2016·Granted Oct 3, 2017·0 cites·10 claims
- 1646US8859964B2Electron microscope and method of adjusting the sameJEOL LTD·Filed 2013·Granted Oct 14, 2014·0 cites·3 claims
- 1745US11251013B2Deflector and charged particle beam systemJEOL LTD·Filed 2020·Granted Feb 15, 2022·0 cites·10 claims
- 1845US9859095B2Electron microscope and measurement methodUNIV TOKYO·Filed 2016·Granted Jan 2, 2018·0 cites·7 claims
- 1939US5181071AApparatus for evaluating characteristics of photosensitive drum for electrophotographyYAMANASHI DENSHI KOGYO KK·Filed 1991·Granted Jan 19, 1993·5 cites·5 claims
- 2038US9396904B2Multipole lens, method of fabricating same, and charged particle beam systemJEOL LTD·Filed 2015·Granted Jul 19, 2016·0 cites·13 claims
- 2136US9576768B2Multipole lens and charged particle beam systemJEOL LTD·Filed 2016·Granted Feb 21, 2017·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →