Inventor · disambiguated record
Yutaka Komai
Also filed as: KOMAI YUTAKA
4 granted patents·145 citations·filing 1996–1999
81Inventor score
Top patents by PatentIndex Score
4 records- 0184US6385125B1Synchronous semiconductor integrated circuit device capable of test time reductionMITSUBISHI ELECTRIC CORP·Filed 1998·Granted May 7, 2002·57 cites·12 claims
- 0277US5706234ATesting and repair of wide I/O semiconductor memory devices designed for testingTEXAS INSTRUMENTS INC·Filed 1996·Granted Jan 6, 1998·45 cites·35 claims
- 0366US6069829AInternal clock multiplication for test time reductionTEXAS INSTRUMENTS INC·Filed 1999·Granted May 30, 2000·25 cites·21 claims
- 0450US6204548B1Fuse for semiconductor device and semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1997·Granted Mar 20, 2001·18 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →