Inventor · disambiguated record
Yukihito Kondo
Also filed as: KONDO YUKIHITO
8 granted patents·84 citations·filing 1985–2017
86Inventor score
Top patents by PatentIndex Score
8 records- 0176US10361061B2Electron microscope and image acquisition methodJEOL LTD·Filed 2017·Granted Jul 23, 2019·2 cites·7 claims
- 0267US6841775B2Electron microscopeJEOL LTD·Filed 2003·Granted Jan 11, 2005·12 cites·6 claims
- 0364US7683320B2Transmission electron microscopeJEOL LTD·Filed 2007·Granted Mar 23, 2010·2 cites·7 claims
- 0459US4623783AMethod of displaying diffraction pattern by electron microscopeJEOL LTD·Filed 1985·Granted Nov 18, 1986·11 cites·4 claims
- 0556US6573502B2Combined electron microscopeJEOL LTD·Filed 2002·Granted Jun 3, 2003·3 cites·6 claims
- 0656US6242737B1Microscopic system equipt with an electron microscope and a scanning probe microscopeJAPAN SCIENCE & TECH CORP·Filed 1998·Granted Jun 5, 2001·26 cites·3 claims
- 0754US5004919ATransmission electron microscopeJEOL LTD·Filed 1990·Granted Apr 2, 1991·12 cites·12 claims
- 0838US5039864ADevice for replacing electron microscope specimensJEOL LTD·Filed 1990·Granted Aug 13, 1991·16 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →