Inventor · disambiguated record
Yusaku Konno
Also filed as: KONNO YUSAKU
12 granted patents·6 pending applications·87 citations·filing 2008–2020
88Inventor score
Top patents by PatentIndex Score
18 records- 0193US8759929B2Solid-state imaging deviceSHIOZAWA KAZUFUMI·Filed 2010·Granted Jun 24, 2014·56 cites·14 claims
- 0288US8648435B2Solid-state imaging device and method for manufacturing sameKONNO YUSAKU·Filed 2010·Granted Feb 11, 2014·8 cites·12 claims
- 0385US8963267B2Solid-state imaging device and manufacturing method of solid-state imaging deviceKOKUBUN KOICHI·Filed 2012·Granted Feb 24, 2015·4 cites·18 claims
- 0484US12367659B2Learning device, learning method, inference device, and storage mediumMITSUBISHI ELECTRIC CORP·Filed 2020·Granted Jul 22, 2025·2 cites·15 claims
- 0579US8953249B2Method of manufacturing an apodizer, and optical moduleTOSHIBA KK·Filed 2013·Granted Feb 10, 2015·5 cites·3 claims
- 0677US8649591B2Pattern inspection apparatus and pattern inspection methodKANEKO MAKOTO·Filed 2011·Granted Feb 11, 2014·4 cites·20 claims
- 0775US9176074B2Pattern inspection method and pattern inspection apparatusTOSHIBA KK·Filed 2013·Granted Nov 3, 2015·4 cites·20 claims
- 0871US8890984B2Solid-state imaging elementKONNO YUSAKU·Filed 2012·Granted Nov 18, 2014·2 cites·20 claims
- 0971US7868285B2Array-type light receiving device and light collection methodTOSHIBA KK·Filed 2008·Granted Jan 11, 2011·2 cites·18 claims
- 1058US9059055B2Solid-state imaging deviceTOSHIBA KK·Filed 2013·Granted Jun 16, 2015·0 cites·19 claims
- 1158US8823123B2Solid-state image sensorKOKUBUN KOICHI·Filed 2012·Granted Sep 2, 2014·0 cites·20 claims
- 1256US2013032915A1Solid state imaging device and method for manufacturing the sameTOSHIBA KK·Filed 2012·Application pending·0 cites
- 1348US2010224760A1Imaging device and method for manufacturing same, and imaging methodTOSHIBA KK·Filed 2010·Application pending·0 cites
- 1441US2012242985A1Pattern inspection apparatus and pattern inspection methodWATABIKI MITSUTOSHI·Filed 2012·Application pending·0 cites
- 1537US8502988B2Pattern inspection apparatus and pattern inspection methodKONNO YUSAKU·Filed 2010·Granted Aug 6, 2013·0 cites·10 claims
- 1637US2012242995A1Pattern inspection apparatus and pattern inspection methodKONNO YUSAKU·Filed 2012·Application pending·0 cites
- 1736US2013063721A1Pattern inspection apparatus and methodFUJII TAKAYOSHI·Filed 2012·Application pending·0 cites
- 1835US2015255665A1Laser heating treatment method and method for manufacturing solid-state imaging deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →