Inventor · disambiguated record
Yuji Konyuba
Also filed as: KONYUBA YUJI
9 granted patents·2 pending applications·11 citations·filing 2013–2024
78Inventor score
Files withJEOL LTD11
Top patents by PatentIndex Score
11 records- 0184US8829436B2Phase plate and method of fabricating sameJEOL LTD·Filed 2013·Granted Sep 9, 2014·8 cites·14 claims
- 0272US9613780B2Method of fabricating sample support membraneJEOL LTD·Filed 2015·Granted Apr 4, 2017·2 cites·15 claims
- 0369US10541111B2Distortion measurement method for electron microscope image, electron microscope, distortion measurement specimen, and method of manufacturing distortion measurement specimenJEOL LTD·Filed 2018·Granted Jan 21, 2020·1 cites·14 claims
- 0461US11953410B2Specimen support tool, support apparatus and specimen preparation methodJEOL LTD·Filed 2021·Granted Apr 9, 2024·0 cites·6 claims
- 0559US12253445B2Specimen pretreatment methodJEOL LTD·Filed 2021·Granted Mar 18, 2025·0 cites·6 claims
- 0658US12431328B2Electron microscope and calibration methodJEOL LTD·Filed 2023·Granted Sep 30, 2025·0 cites·5 claims
- 0758US2025061606A1Electron Microscope and Calibration MethodJEOL LTD·Filed 2024·Application pending·0 cites
- 0857US11658000B2Sample support and method of fabricating sameJEOL LTD·Filed 2020·Granted May 23, 2023·0 cites·8 claims
- 0949US11679489B2Sample chip worktable and retainerJEOL LTD·Filed 2020·Granted Jun 20, 2023·0 cites·9 claims
- 1042US2020371331A1Image Processing Method and Transmission Electron MicroscopeJEOL LTD·Filed 2020·Application pending·0 cites
- 1141US11037755B2Observation method, specimen support, and transmission electron microscopeJEOL LTD·Filed 2019·Granted Jun 15, 2021·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →