Inventor · disambiguated record
Yuichi Kunitomo
Also filed as: KUNITOMO YUICHI
16 granted patents·1 pending application·64 citations·filing 1991–2022
90Inventor score
Files withSEIKO EPSON CORP10HITACHI CONSTRUCTION MACHINERY5HITACHI KENKI FINE TECH CO LTD1KURENUMA TORU1
Top patents by PatentIndex Score
17 records- 0189US11380287B2Display system, electronic device, and display methodSEIKO EPSON CORP·Filed 2021·Granted Jul 5, 2022·2 cites·7 claims
- 0279US7498589B2Scanning probe microscopeHITACHI KENKI FINE TECH CO LTD·Filed 2005·Granted Mar 3, 2009·8 cites·10 claims
- 0378US10685595B2Connection device, display device, and control method for the display deviceSEIKO EPSON CORP·Filed 2019·Granted Jun 16, 2020·2 cites·6 claims
- 0463US10930200B2Connection device, display device, and control method for the display deviceSEIKO EPSON CORP·Filed 2020·Granted Feb 23, 2021·0 cites·10 claims
- 0560US10971113B2Display system, electronic device, and display methodSEIKO EPSON CORP·Filed 2018·Granted Apr 6, 2021·0 cites·14 claims
- 0658US12293012B2Head-mounted device, control method and control program for head-mounted deviceSEIKO EPSON CORP·Filed 2022·Granted May 6, 2025·0 cites·9 claims
- 0756US5293326AUltrasonic inspection and imaging instrumentHITACHI CONSTRUCTION MACHINERY·Filed 1991·Granted Mar 8, 1994·24 cites·14 claims
- 0852US11322115B2Display system, display control method, and programSEIKO EPSON CORP·Filed 2020·Granted May 3, 2022·0 cites·8 claims
- 0952US10121409B2Display device, method of controlling display device, and programSEIKO EPSON CORP·Filed 2016·Granted Nov 6, 2018·0 cites·15 claims
- 1050US10902819B2Connection device, display device, and control method for the display deviceSEIKO EPSON CORP·Filed 2019·Granted Jan 26, 2021·0 cites·8 claims
- 1149US10948974B2Head-mounted display device, program, and method for controlling head-mounted display deviceSEIKO EPSON CORP·Filed 2018·Granted Mar 16, 2021·0 cites·13 claims
- 1245US10732918B2Display system, method of controlling display system, and display deviceSEIKO EPSON CORP·Filed 2018·Granted Aug 4, 2020·0 cites·14 claims
- 1344US2008087820A1Probe control method for scanning probe microscopeKURENUMA TORU·Filed 2007·Application pending·0 cites
- 1442US9212469B2Work machineHITACHI CONSTRUCTION MACHINERY·Filed 2012·Granted Dec 15, 2015·0 cites·3 claims
- 1542US5623100AUltrasonic inspection and imaging intstrumentHITACHI CONSTRUCTION MACHINERY·Filed 1995·Granted Apr 22, 1997·11 cites·9 claims
- 1637US5481917AUltrasonic inspection and imaging instrumentHITACHI CONSTRUCTION MACHINERY·Filed 1994·Granted Jan 9, 1996·10 cites·10 claims
- 1732US5179954AUltrasonic inspection and imaging instrumentHITACHI CONSTRUCTION MACHINERY·Filed 1991·Granted Jan 19, 1993·7 cites·17 claims
Join the waitlist — get patent alerts
Get an alert when Yuichi Kunitomo files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →