Inventor · disambiguated record
Yueh-Yi Lai
Also filed as: LAI YUEH-YI
4 granted patents·1 pending application·5 citations·filing 2015–2022
60Inventor score
Files withIND TECH RES INST5
Top patents by PatentIndex Score
5 records- 0175US10008005B2Measurement system and method for measuring multi-dimensionsIND TECH RES INST·Filed 2016·Granted Jun 26, 2018·4 cites·18 claims
- 0265US11162784B2Profile measurement system and profile measurement methodIND TECH RES INST·Filed 2019·Granted Nov 2, 2021·1 cites·18 claims
- 0347US10571252B2Surface topography optical measuring system and surface topography optical measuring methodIND TECH RES INST·Filed 2018·Granted Feb 25, 2020·0 cites·15 claims
- 0437US12412281B2Method and system for remote sharing three dimensional space annotation trajectoryIND TECH RES INST·Filed 2022·Granted Sep 9, 2025·0 cites·22 claims
- 0530US2017169556A1Workpiece measuring apparatus and method for measuring a workpieceIND TECH RES INST·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →