Inventor · disambiguated record
Yu-Ting Lin
Also filed as: LIN YU · LIN YU-TING
126 granted patents·85 pending applications·353 citations·filing 1990–2025
99Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD51NANYA TECHNOLOGY CORP37LIN YU-TING13TAIWAN SEMICONDUCTOR MFG12BENQ CORP11
Top patents by PatentIndex Score
211 records- 0198US11374009B2Integrated circuit device and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2020·Granted Jun 28, 2022·4 cites·6 claims
- 0295US11309316B1Semiconductor device with single step height and method for fabricating the sameNANYA TECHNOLOGY CORP·Filed 2020·Granted Apr 19, 2022·6 cites·18 claims
- 0395US10510851B2Low resistance contact method and structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 17, 2019·10 cites·20 claims
- 0493US9612468B1Display apparatusYOUNG LIGHTING TECHNOLOGY INC·Filed 2016·Granted Apr 4, 2017·16 cites·24 claims
- 0590US11264391B1Semiconductor structure and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2020·Granted Mar 1, 2022·2 cites·8 claims
- 0689US10685842B2Selective formation of titanium silicide and titanium nitride by hydrogen gas controlTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 16, 2020·4 cites·20 claims
- 0789US2025362335A1Inspection apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0888US12446255B2Semiconductor structure with source/drain multi-layer structure and method for forming the samePARABELLUM STRATEGIC OPPORTUNITIES FUND LLC·Filed 2024·Granted Oct 14, 2025·0 cites·16 claims
- 0988US12158227B2Flow control structure of water hose jointLIN YU TING·Filed 2023·Granted Dec 3, 2024·1 cites·11 claims
- 1088US11472435B2Trajectory determination method for a vehicleAUTOMOTIVE RES & TESTING CT·Filed 2020·Granted Oct 18, 2022·2 cites·7 claims
- 1188US10153203B2Methods for forming metal layers in openings and apparatus for forming sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 11, 2018·8 cites·20 claims
- 1287US12313675B2Method and device for wafer-level testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted May 27, 2025·0 cites·20 claims
- 1387US12270852B2Method and system for wafer-level testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Apr 8, 2025·0 cites·20 claims
- 1487US10588932B2Method for promoting hair growth using banana stamen extractTCI CO LTD·Filed 2018·Granted Mar 17, 2020·2 cites·11 claims
- 1587US10216744B2Data migration to a cloud computing systemMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2015·Granted Feb 26, 2019·8 cites·20 claims
- 1687US9613465B1Method for suturing 3D coordinate information and the device using the sameIND TECH RES INST·Filed 2015·Granted Apr 4, 2017·9 cites·14 claims
- 1786US12512324B2Selective formation of titanium silicide and titanium nitride by hydrogen gas controlTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Dec 30, 2025·0 cites·20 claims
- 1886USD1009244SCeiling fanLIN YU TING·Filed 2022·Granted Dec 26, 2023·9 cites·1 claims
- 1986US10468530B2Semiconductor structure with source/drain multi-layer structure and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Nov 5, 2019·2 cites·20 claims
- 2085US8643614B2Touch-sensitive device and touch-sensitive display deviceWU MING-KUNG·Filed 2011·Granted Feb 4, 2014·7 cites·48 claims
- 2185US8502335B2CMOS image sensor big via bonding pad application for AlCu ProcessTSENG UWAY·Filed 2009·Granted Aug 6, 2013·15 cites·20 claims
- 2285US8344471B2CMOS image sensor big via bonding pad application for AICu processTAIWAN SEMICONDUCTOR MFG·Filed 2009·Granted Jan 1, 2013·11 cites·20 claims
- 2384US11232945B2Conductive feature formation and structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jan 25, 2022·1 cites·20 claims
- 2484US10157785B2Semiconductor device and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 18, 2018·3 cites·20 claims
- 2584US6793721B2Invisible ink composition and method to ensure document confidentialityBENQ CORP·Filed 2002·Granted Sep 21, 2004·22 cites·23 claims
- 2684US2025234520A1Semiconductor structure including polysilicon as bottom layer of bit line structure and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 2783US12066484B2Method and device for wafer-level testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Aug 20, 2024·0 cites·20 claims
- 2883US11990550B2Semiconductor structure with source/drain multi-layer structure and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted May 21, 2024·0 cites·20 claims
- 2983US11073551B2Method and system for wafer-level testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 27, 2021·1 cites·20 claims
- 3083US9323737B2Generating an interactive page template based on setting a material type and a plurality of input and output signals for a mobile deviceINST INFORMATION INDUSTRY·Filed 2013·Granted Apr 26, 2016·9 cites·16 claims
- 3183US8730195B2Touch-sensitive device and touch-sensitive display deviceWINTEK CORP·Filed 2013·Granted May 20, 2014·5 cites·28 claims
- 3283US6793722B2Inkjet ink composition with high chromaBENQ CORP·Filed 2002·Granted Sep 21, 2004·15 cites·36 claims
- 3382US12025655B2Method and system for wafer-level testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jul 2, 2024·0 cites·20 claims
- 3482US11295956B2Selective formation of titanium silicide and titanium nitride by hydrogen gas controlTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 5, 2022·1 cites·20 claims
- 3582US10867845B2Semiconductor device and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 15, 2020·2 cites·14 claims
- 3681US10012857B2Display apparatus including a prism moduleCHAMP VISION DISPLAY INC·Filed 2016·Granted Jul 3, 2018·2 cites·21 claims
- 3781US8711135B2Driving system of display panel having a circuit of a voltage generator and driving method thereofLIN YU-TING·Filed 2011·Granted Apr 29, 2014·5 cites·10 claims
- 3880US12230450B2Semiconductor structureNANYA TECHNOLOGY CORP·Filed 2024·Granted Feb 18, 2025·0 cites·8 claims
- 3980US2025359162A1Field effect transistor with strained channels and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 4080US2025234518A1Semiconductor structure including polysilicon as bottom layer of bit line structure and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 4180US2025261358A1Method of manufacturing semiconductor device including 3d memory structureNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 4280US2025234516A1Semiconductor structure including polysilicon as bottom layer of bit line structure and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 4379US11023045B2System for recognizing user gestures according to mechanomyogram detected from user's wrist and method thereofCOOLSO TECH INC·Filed 2020·Granted Jun 1, 2021·4 cites·10 claims
- 4479US8435893B1Semiconductor device and method of formationNIAN JUN-NAN·Filed 2011·Granted May 7, 2013·6 cites·13 claims
- 4578US11754621B2Method and device for wafer-level testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 12, 2023·0 cites·19 claims
- 4678US7180173B2Heat spreader ball grid array (HSBGA) design for low-k integrated circuits (IC)TAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Feb 20, 2007·25 cites·30 claims
- 4777US12482657B2Method of manufacturing semiconductor structure using multi-layer hard maskNANYA TECHNOLOGY CORP·Filed 2022·Granted Nov 25, 2025·0 cites·19 claims
- 4877US12317482B2Semiconductor structure and method of manufacturing the same including buried word lines of different widthsNANYA TECHNOLOGY CORP·Filed 2022·Granted May 27, 2025·0 cites·20 claims
- 4977US12087575B2Conductive feature formation and structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 10, 2024·0 cites·20 claims
- 5077US11972951B2Selective formation of titanium silicide and titanium nitride by hydrogen gas controlTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Apr 30, 2024·0 cites·20 claims
Showing the top 50 of 211 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →