Inventor · disambiguated record
Yuan-Li Lin
Also filed as: LIN YUAN-LI
1 granted patent·3 pending applications·2 citations·filing 2014–2025
17Inventor score
Technology areasG01R
Files withTAIWAN SEMICONDUCTOR MFG CO LTD4
Top patents by PatentIndex Score
4 records- 0171US2025362322A1Methods of forming a probe card for fine pitch circuit probe testing of semiconductor integrated circuit devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0261US9759745B2Probe cardTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Sep 12, 2017·2 cites·20 claims
- 0356US2024272200A1Probe card for fine pitch circuit probe testing of semiconductor integrated circuit devices and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0451US2025116698A1Semiconductor testing apparatus and method for testing semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →