Inventor · disambiguated record
Yung-Tao Lin
Also filed as: LIN YUNG TAO
28 granted patents·1 pending application·939 citations·filing 1995–2007
98Inventor score
Files withCHARTERED SEMICONDUCTOR MFG17ADVANCED MICRO DEVICES INC10KAO YA-CHEN1TAIWAN SEMICONDUCTOR MFG1
Top patents by PatentIndex Score
29 records- 0194US5917332AArrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor waferADVANCED MICRO DEVICES INC·Filed 1996·Granted Jun 29, 1999·110 cites·28 claims
- 0293US5896294AMethod and apparatus for inspecting manufactured products for defects in response to in-situ monitoringADVANCED MICRO DEVICES INC·Filed 1997·Granted Apr 20, 1999·145 cites·19 claims
- 0388US5930138AArrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runsADVANCED MICRO DEVICES INC·Filed 1997·Granted Jul 27, 1999·85 cites·7 claims
- 0483US6703659B2Low voltage programmable and erasable flash EEPROMCHARTERED SEMICONDUCTOR MFG·Filed 2003·Granted Mar 9, 2004·21 cites·6 claims
- 0583US5598341AReal-time in-line defect disposition and yield forecasting systemADVANCED MICRO DEVICES INC·Filed 1995·Granted Jan 28, 1997·82 cites·17 claims
- 0682US6649461B1Method of angle implant to improve transistor reverse narrow width effectCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Nov 18, 2003·35 cites·21 claims
- 0780US6518122B1Low voltage programmable and erasable flash EEPROMCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Feb 11, 2003·43 cites·24 claims
- 0880US5761065AArrangement and method for detecting sequential processing effects in manufacturingADVANCED MICRO DEVICES INC·Filed 1995·Granted Jun 2, 1998·61 cites·28 claims
- 0978US6284603B1Flash memory cell structure with improved channel punch-through characteristicsCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Sep 4, 2001·34 cites·20 claims
- 1077US8110881B2MRAM cell structure with a blocking layer for avoiding short circuitsKAO YA-CHEN·Filed 2007·Granted Feb 7, 2012·7 cites·19 claims
- 1177US6362045B1Method to form non-volatile memory cellsCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Mar 26, 2002·33 cites·20 claims
- 1276US6147008ACreation of multiple gate oxide with high thickness ratio in flash memory processCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Nov 14, 2000·40 cites·11 claims
- 1375US6509264B1Method to form self-aligned silicide with reduced sheet resistanceCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Jan 21, 2003·18 cites·20 claims
- 1475US6001663AApparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the sameADVANCED MICRO DEVICES INC·Filed 1999·Granted Dec 14, 1999·46 cites·6 claims
- 1572US6569699B1Two layer mirror for LCD-on-silicon products and method of fabrication thereofCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted May 27, 2003·12 cites·38 claims
- 1669US7514740B2Logic compatible storage deviceTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Apr 7, 2009·7 cites·16 claims
- 1769US6399443B1Method for manufacturing dual voltage flash integrated circuitCHARTERED SEMICONDUCTOR MFG·Filed 2001·Granted Jun 4, 2002·15 cites·25 claims
- 1866US6828194B2Low voltage programmable and erasable flash EEPROMCHARTERED SEMICONDUCTOR MFG·Filed 2003·Granted Dec 7, 2004·7 cites·4 claims
- 1964US6177304B1Self-aligned contact process using a poly-cap maskCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Jan 23, 2001·25 cites·20 claims
- 2062US6376298B1Layout method for scalable design of the aggressive RAM cells using a poly-cap maskCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Apr 23, 2002·11 cites·20 claims
- 2161US6180430B1Methods to reduce light leakage in LCD-on-silicon devicesCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Jan 30, 2001·28 cites·24 claims
- 2261US5821765AApparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the sameADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 13, 1998·20 cites·8 claims
- 2359US6573143B1Trench transistor structure and formation methodCHARTERED SEMICONDUCTOR MFG·Filed 2001·Granted Jun 3, 2003·9 cites·16 claims
- 2456US6822268B2Two layer mirror for LCD-on-silicon products and method of fabrication thereofCHARTERED SEMICONDUCTOR MFG·Filed 2003·Granted Nov 23, 2004·4 cites·14 claims
- 2556US5670891AStructures to extract defect size information of poly and source-drain semiconductor devices and method for making the sameADVANCED MICRO DEVICES INC·Filed 1995·Granted Sep 23, 1997·16 cites·18 claims
- 2655US6760258B2Means to erase a low voltage programmable and erasable flash EEPROMCHARTERED SEMICONDUCTOR MFG·Filed 2003·Granted Jul 6, 2004·3 cites·7 claims
- 2754US5716856AArrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runsADVANCED MICRO DEVICES INC·Filed 1995·Granted Feb 10, 1998·17 cites·9 claims
- 2838US5963780AMethod for detecting defect sizes in polysilicon and source-drain semiconductor devicesADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 5, 1999·5 cites·10 claims
- 2938US2003124844A1Method to form self-aligned silicide with reduced sheet resistanceCHARTERED SEMICONDUCTOR MFG·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →