Inventor · disambiguated record
Yun-Sung Na
Also filed as: NA YUN SUNG
37 granted patents·1 pending application·196 citations·filing 2001–2015
97Inventor score
Top patents by PatentIndex Score
38 records- 0192US7954869B2Pick and place apparatusTECHWING CO LTD·Filed 2006·Granted Jun 7, 2011·23 cites·18 claims
- 0292US7948255B2Test handlerTECHWING CO LTD·Filed 2006·Granted May 24, 2011·18 cites·3 claims
- 0389US8141922B2Pick-and-place apparatusSHIM JAE-GYUN·Filed 2007·Granted Mar 27, 2012·17 cites·6 claims
- 0487US8496426B2Pick and place apparatus for electronic device inspection equipment, picking apparatus thereof, and method for loading electronic devices onto loading elementNA YUN-SUNG·Filed 2010·Granted Jul 30, 2013·8 cites·5 claims
- 0587US8038191B2Pick and place apparatusTECHWING CO LTD·Filed 2008·Granted Oct 18, 2011·13 cites·9 claims
- 0683US6844717B2Test handlerTECHWING CO LTD·Filed 2001·Granted Jan 18, 2005·32 cites·19 claims
- 0780US7538542B2Test handler and operation method thereofTECHWING CO LTD·Filed 2006·Granted May 26, 2009·6 cites·9 claims
- 0879US6651817B2Test tray insert of test handlerTECHWING CO LTD·Filed 2001·Granted Nov 25, 2003·24 cites·6 claims
- 0977US8154314B2Side-docking type test handler and apparatus for transferring test tray for sameSHIM JAE GYUN·Filed 2009·Granted Apr 10, 2012·7 cites·5 claims
- 1075US7667453B2Test tray for test handlerTECHWING CO LTD·Filed 2008·Granted Feb 23, 2010·2 cites·14 claims
- 1174US7557564B2Test handler comprising at least one opening unit opening one part of the plurality of insertsTECHWING CO LTD·Filed 2007·Granted Jul 7, 2009·4 cites·10 claims
- 1273US8496113B2Insert for carrier board of test handlerNA YUN-SUNG·Filed 2008·Granted Jul 30, 2013·7 cites·2 claims
- 1370US8258804B2Test tray for test handlerSHIM JAE-GYUN·Filed 2007·Granted Sep 4, 2012·3 cites·7 claims
- 1469US8376431B2Pick-and-place module for test handlerTECHWING CO LTD·Filed 2010·Granted Feb 19, 2013·3 cites·5 claims
- 1569US7656150B2Test handler and loading method thereofTECHWING CO LTD·Filed 2007·Granted Feb 2, 2010·5 cites·7 claims
- 1668US8277162B2Unit for opening insert for test tray and method of mounting semiconductor device using the sameNA YUN SUNG·Filed 2009·Granted Oct 2, 2012·3 cites·11 claims
- 1767US8026735B2Test handlerTECHWING CO LTD·Filed 2009·Granted Sep 27, 2011·2 cites·2 claims
- 1866US7741836B2Test tray transferring apparatus for a test handler, test handler, and method of transferring test trays for a test handlerTECHWING CO LTD·Filed 2008·Granted Jun 22, 2010·3 cites·7 claims
- 1966US7723981B2Method for transferring test trays in a side-docking type test handlerTECHWING CO LTD·Filed 2009·Granted May 25, 2010·2 cites·7 claims
- 2064US8653845B2Test handler and method for operating the same for testing semiconductor devicesSHIM JAE-GYUN·Filed 2011·Granted Feb 18, 2014·1 cites·3 claims
- 2164US7898271B2Position changing apparatus for test handler and power transferring apparatusTECHWING CO LTD·Filed 2009·Granted Mar 1, 2011·1 cites·10 claims
- 2262US8013620B2Test handler and loading method thereofTECHWING CO LTD·Filed 2009·Granted Sep 6, 2011·3 cites·3 claims
- 2359US8570058B2Carrier board transfer system for handler that supports testing of electronic devices and method for transferring carrier board in chamber of handlerNA YUN-SUNG·Filed 2009·Granted Oct 29, 2013·2 cites·8 claims
- 2458US7923989B2Test handlerTECHWING CO LTD·Filed 2008·Granted Apr 12, 2011·2 cites·6 claims
- 2558US7816910B2Test handler having size-changeable test siteTECHWING CO LTD·Filed 2009·Granted Oct 19, 2010·2 cites·24 claims
- 2655US8523163B2Insert for carrier board of test handlerNA YUN-SUNG·Filed 2009·Granted Sep 3, 2013·2 cites·14 claims
- 2751US8926259B2Pick and place apparatus for electronic device inspection equipmentTECHWING CO LTD·Filed 2013·Granted Jan 6, 2015·0 cites·1 claims
- 2851US8159252B2Test handler and method for operating the same for testing semiconductor devicesSHIM JAE-GYUN·Filed 2007·Granted Apr 17, 2012·0 cites·3 claims
- 2951US7656152B2Pusher for match plate of test handlerTECHWING CO LTD·Filed 2008·Granted Feb 2, 2010·1 cites·5 claims
- 3049US8058890B2Test HandlerSHIM JAE-GYUN·Filed 2011·Granted Nov 15, 2011·0 cites·2 claims
- 3147US7876117B2Operating method of test handlerTECHWING CO LTD·Filed 2010·Granted Jan 25, 2011·0 cites·5 claims
- 3246US8523158B2Opener and buffer table for test handlerNA YUN-SUNG·Filed 2008·Granted Sep 3, 2013·0 cites·6 claims
- 3345US7696745B2Operating method of test handlerTECHWING CO LTD·Filed 2008·Granted Apr 13, 2010·0 cites·8 claims
- 3443US8333083B2System to support testing of electronic devices, temperature control unit for the system, and method for controlling internal temperature of chamber of the systemNA YUN-SUNG·Filed 2009·Granted Dec 18, 2012·0 cites·12 claims
- 3542US2008191687A1Test Handler Having Size-Changeable Test SiteTECHWING CO LTD·Filed 2006·Application pending·0 cites
- 3638US8558569B2Opener for test handlerNA YUN-SUNG·Filed 2011·Granted Oct 15, 2013·0 cites·2 claims
- 3731US8919755B2Hi-fix board clamping apparatus for use in test handlerSHIM JAE GYUN·Filed 2007·Granted Dec 30, 2014·0 cites·3 claims
- 3822US9958498B2Test handler and circulation method of test trays in test handlerTECHWING CO LTD·Filed 2015·Granted May 1, 2018·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →