Inventor · disambiguated record
Yuzo Nagumo
Also filed as: NAGUMO YUZO
6 granted patents·1 pending application·8 citations·filing 2005–2014
71Inventor score
Files withSHIMADZU CORP7
Top patents by PatentIndex Score
7 records- 0167US7760356B2Optical measuring device and method, and nanoparticle measuring method and deviceSHIMADZU CORP·Filed 2005·Granted Jul 20, 2010·4 cites·14 claims
- 0265US7911610B2Optical measuring deviceSHIMADZU CORP·Filed 2006·Granted Mar 22, 2011·2 cites·7 claims
- 0363US9228828B2Thickness monitoring device, etching depth monitoring device and thickness monitoring methodSHIMADZU CORP·Filed 2013·Granted Jan 5, 2016·2 cites·12 claims
- 0442US9007599B2Depth of hole measurement by subtracting area of two spectra separated by timeSHIMADZU CORP·Filed 2013·Granted Apr 14, 2015·0 cites·2 claims
- 0539US9460973B2Surface processing progress monitoring systemSHIMADZU CORP·Filed 2014·Granted Oct 4, 2016·0 cites·7 claims
- 0638US9001337B2Etching monitor deviceSHIMADZU CORP·Filed 2013·Granted Apr 7, 2015·0 cites·4 claims
- 0737US2013169958A1Surface Processing Progress Monitoring SystemSHIMADZU CORP·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →