Inventor · disambiguated record
Yun Suk Nam
Also filed as: NAM YUN SUK
5 granted patents·7 pending applications·16 citations·filing 2008–2025
71Inventor score
Top patents by PatentIndex Score
12 records- 0184US10629742B2Semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Apr 21, 2020·4 cites·18 claims
- 0277US11211497B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Dec 28, 2021·1 cites·19 claims
- 0373US9230386B2Product providing apparatus, display apparatus, and method for providing GUI using the sameROH UI-CHOL·Filed 2008·Granted Jan 5, 2016·11 cites·37 claims
- 0459US2025318101A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0555US2023402382A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0655US2025031359A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0754US2009313139A1Product providing apparatus and method for providing gui using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2009·Application pending·0 cites
- 0853US2024203831A1Semiconductor device and method for manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0946US2025378856A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1042US2025380394A1Semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1139US8592104B2Mask for forming patterns of semiconductor deviceNAM YUN-SUK·Filed 2011·Granted Nov 26, 2013·0 cites·20 claims
- 1235US9805929B2Method of forming fine patterns in a semiconductor device and method of manufacturing an electronic deviceSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Oct 31, 2017·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Yun Suk Nam files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →