Inventor · disambiguated record
Yuichiro Ohmae
Also filed as: OHMAE YUICHIRO
20 granted patents·5 pending applications·67 citations·filing 2005–2025
91Inventor score
Files withSYSMEX CORP19TPO HONG KONG HOLDING LTD2KITAGAWA NOBUHIRO1OHMAE YUICHIRO1TPO DISPLAYS CORP1
Top patents by PatentIndex Score
25 records- 0189US9157925B2Specimen transporter, specimen testing system and specimen transporting methodSYSMEX CORP·Filed 2013·Granted Oct 13, 2015·9 cites·20 claims
- 0280US10801929B2Specimen smearing apparatus, specimen smearing method, smear sample preparing apparatus, and smear sample preparing methodSYSMEX CORP·Filed 2018·Granted Oct 13, 2020·1 cites·19 claims
- 0378US8864030B2Sample analyzer, method of obtaining sample identification information and sample identification information obtaining apparatusOHMAE YUICHIRO·Filed 2011·Granted Oct 21, 2014·6 cites·16 claims
- 0477US10723552B2Sample measurement system and method of transporting in and out rackSYSMEX CORP·Filed 2017·Granted Jul 28, 2020·1 cites·10 claims
- 0576USD701972SStorage case for sample plateSYSMEX CORP·Filed 2013·Granted Apr 1, 2014·24 cites·1 claims
- 0676US2022357245A1Specimen smearing apparatus, specimen smearing method, smear sample preparing apparatus, and smear sample preparing methodSYSMEX CORP·Filed 2022·Application pending·0 cites
- 0776US2025231207A1Method for controlling specimen analysis system and specimen analysis systemSYSMEX CORP·Filed 2025·Application pending·0 cites
- 0874US12498386B2Method for controlling specimen analysis system and specimen analysis systemSYSMEX CORP·Filed 2022·Granted Dec 16, 2025·0 cites·13 claims
- 0972USD704348SAutomatic analyzerSYSMEX CORP·Filed 2013·Granted May 6, 2014·19 cites·1 claims
- 1071US11422072B2Specimen smearing apparatus, specimen smearing method, smear sample preparing apparatus, and smear sample preparing methodSYSMEX CORP·Filed 2020·Granted Aug 23, 2022·0 cites·20 claims
- 1171US9329196B2Specimen storage device, specimen storing method, and rackSYSMEX CORP·Filed 2013·Granted May 3, 2016·2 cites·20 claims
- 1270US10145768B2Smear preparation apparatus and smear preparation methodSYSMEX CORP·Filed 2017·Granted Dec 4, 2018·1 cites·33 claims
- 1366US9103807B2Rack collecting unit and sample processing apparatusKITAGAWA NOBUHIRO·Filed 2010·Granted Aug 11, 2015·1 cites·16 claims
- 1459US9417253B2Specimen processing system and specimen container classifying apparatusYONEKURA YASUO·Filed 2009·Granted Aug 16, 2016·2 cites·9 claims
- 1553US11340245B2Transport device, sample measurement system, and transport methodSYSMEX CORP·Filed 2019·Granted May 24, 2022·0 cites·20 claims
- 1647US9297823B2Specimen transporter and specimen imaging systemSYSMEX CORP·Filed 2013·Granted Mar 29, 2016·0 cites·18 claims
- 1744US11181540B2Measurement system, rack export-import unit, and method of exporting and importing racksSYSMEX CORP·Filed 2017·Granted Nov 23, 2021·0 cites·14 claims
- 1842US2018003729A1Sample measurement system and method of retrieving tray identification informationSYSMEX CORP·Filed 2017·Application pending·0 cites
- 1938US10101346B2Sample analyzer, transportation apparatus, and methodSYSMEX CORP·Filed 2016·Granted Oct 16, 2018·0 cites·13 claims
- 2038US2008252962A1Electronic Ink Display Device and Method for Manufacturing the SameTPO HONG KONG HOLDING LTD·Filed 2005·Application pending·0 cites
- 2137US11397190B2Test systemSYSMEX CORP·Filed 2015·Granted Jul 26, 2022·0 cites·13 claims
- 2237US10099866B2Transport apparatus and transport methodSYSMEX CORP·Filed 2015·Granted Oct 16, 2018·0 cites·11 claims
- 2337US2010302620A1Electronic ink display device and manufacturing method thereofTPO DISPLAYS CORP·Filed 2005·Application pending·0 cites
- 2435US7847216B2Panel heater and display device using the sameTPO HONG KONG HOLDING LTD·Filed 2005·Granted Dec 7, 2010·0 cites·9 claims
- 2529USD714460SSpecimen transporterSYSMEX CORP·Filed 2013·Granted Sep 30, 2014·1 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →