Inventor · disambiguated record
Yuichi Ohyama
Also filed as: OHYAMA YUICHI
10 granted patents·2 pending applications·296 citations·filing 1983–2006
92Inventor score
Top patents by PatentIndex Score
12 records- 0187US6542830B1Process control systemHITACHI LTD·Filed 1997·Granted Apr 1, 2003·93 cites·25 claims
- 0287US5841893AInspection data analyzing systemHITACHI LTD·Filed 1992·Granted Nov 24, 1998·76 cites·12 claims
- 0383US6757621B2Process management systemHITACHI LTD·Filed 2003·Granted Jun 29, 2004·35 cites·10 claims
- 0478US4583223ATesting systemHITACHI LTD·Filed 1983·Granted Apr 15, 1986·36 cites·15 claims
- 0574US8085238B2Backlight, display apparatus and light source controlling methodMISONOU TAKEHIRO·Filed 2006·Granted Dec 27, 2011·5 cites·13 claims
- 0674US6330352B1Inspection data analyzing systemHITACHI LTD·Filed 2000·Granted Dec 11, 2001·11 cites·2 claims
- 0772US6628817B2Inspection data analyzing systemHITACHI LTD·Filed 2001·Granted Sep 30, 2003·9 cites·25 claims
- 0871US6529619B2Inspection data analyzing systemHITACHI LTD·Filed 2001·Granted Mar 4, 2003·9 cites·3 claims
- 0968US6339653B1Inspection data analyzing systemHITACHI LTD·Filed 2000·Granted Jan 15, 2002·7 cites·12 claims
- 1059US6185322B1Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic deviceHITACHI LTD·Filed 1997·Granted Feb 6, 2001·15 cites·14 claims
- 1152US2007265378A1Polyvinyl Chloride Fiber Reduced in Initial ColorationKANEKA CORP·Filed 2005·Application pending·0 cites
- 1241US2002034326A1Inspection data analyzing systemFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →