Inventor · disambiguated record
Yukio Okano
Also filed as: OGURA TOSHINOBU · OKANO YUKIO
12 granted patents·2 pending applications·383 citations·filing 1975–2021
93Inventor score
Top patents by PatentIndex Score
14 records- 0197US4009939ADouble layered optical low pass filter permitting improved image resolutionMINOLTA CAMERA KK·Filed 1975·Granted Mar 1, 1977·100 cites·10 claims
- 0295US4047807ADiaphragm deviceMINOLTA CAMERA KK·Filed 1975·Granted Sep 13, 1977·38 cites·18 claims
- 0392US4068260ACombination optical low pass filter capable of phase and amplitude modulationMINOLTA CAMERA KK·Filed 1977·Granted Jan 10, 1978·52 cites·21 claims
- 0486US4178611AOptical low pass filterMINOLTA CAMERA KK·Filed 1978·Granted Dec 11, 1979·36 cites·12 claims
- 0582US4101929AColor encoding video system with optical low pass filterMINOLTA CAMERA KK·Filed 1977·Granted Jul 18, 1978·23 cites·12 claims
- 0680US4124276ASoft focus lens systemMINOLTA CAMERA KK·Filed 1976·Granted Nov 7, 1978·36 cites·22 claims
- 0775US4480896AOptical filter suitable for portrait photographyMINOLTA CAMERA KK·Filed 1982·Granted Nov 6, 1984·37 cites·5 claims
- 0870US11772301B2Method for manufacturing hexagonal semiconductor plate crystalMITSUBISHI CHEM CORP·Filed 2021·Granted Oct 3, 2023·0 cites·9 claims
- 0969US4083627ATwo dimensional optical phase grating filterMINOLTA CAMERA KK·Filed 1976·Granted Apr 11, 1978·23 cites·8 claims
- 1063US4264151AOptical adaptor for movie and television camerasMINOLTA CAMERA KK·Filed 1978·Granted Apr 28, 1981·18 cites·9 claims
- 1160US2018079109A1Method for manufacturing hexagonal semiconductor plate crystalMITSUBISHI CHEM CORP·Filed 2017·Application pending·0 cites
- 1259US4100570AOptical image pickup systemHITACHI LTD·Filed 1976·Granted Jul 11, 1978·16 cites·14 claims
- 1353US2013284160A1Method for manufacturing hexagonal semiconductor plate crystalMITSUBISHI CHEM CORP·Filed 2013·Application pending·0 cites
- 1435US4214814AVariable soft focus lens systemMINOLTA CAMERA KK·Filed 1978·Granted Jul 29, 1980·4 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →