Inventor · disambiguated record
Yukio Okuda
Also filed as: OKUDA YUKIO · OMURA MORIKAZU
12 granted patents·2 pending applications·209 citations·filing 1972–2008
92Inventor score
Top patents by PatentIndex Score
14 records- 0190US4127782AAutomotive power supplySAWAFUJI ELECTRIC CO LTD·Filed 1975·Granted Nov 28, 1978·54 cites·16 claims
- 0279US4283920ARefrigerating deviceSAWAFUJI ELECTRIC CO LTD·Filed 1979·Granted Aug 18, 1981·32 cites·7 claims
- 0373US4027211AElectrical vibration type compressorSAWAFUJI ELECTRIC CO LTD·Filed 1975·Granted May 31, 1977·27 cites·28 claims
- 0472US3959389AMethod of manufacturing alkylene oxide adducts of an aliphatic alcoholNIPPON CATALYTIC CHEM IND·Filed 1974·Granted May 25, 1976·11 cites·8 claims
- 0570US4320448AVibrating compressorSAWAFUJI ELECTRIC CO LTD·Filed 1980·Granted Mar 16, 1982·30 cites·10 claims
- 0667US3989763AMethod for recovering alcoholsNIPPON CATALYTIC CHEM IND·Filed 1974·Granted Nov 2, 1976·7 cites·9 claims
- 0766US3932531AMethod of manufacturing alkylene oxide adducts of an aliphatic alcoholNIPPON CATALYTIC CHEM IND·Filed 1972·Granted Jan 13, 1976·8 cites·7 claims
- 0865US6889164B2Method and apparatus of determining defect-free semiconductor integrated circuitSONY CORP·Filed 2001·Granted May 3, 2005·12 cites·30 claims
- 0965US6515500B1Method and apparatus of testing and analyzing CMOS integrated circuitSONY CORP·Filed 2000·Granted Feb 4, 2003·12 cites·29 claims
- 1058US4216385AAC/DC Power supply deviceSAWAFUJI ELECTRIC CO LTD·Filed 1978·Granted Aug 5, 1980·11 cites·27 claims
- 1140US2008229264A1Semiconductor evaluation apparatus, semiconductor evaluation method and semiconductor evaluation programSONY CORP·Filed 2008·Application pending·0 cites
- 1235US4147970ADirect current power supply device for battery chargingSAWAFUJI ELECTRIC CO LTD·Filed 1976·Granted Apr 3, 1979·5 cites·14 claims
- 1334US2002178890A1Cutting toolFiled 2001·Application pending·0 cites
- 1433US3941815AProcess for the preparation of 5-nitro-1,4-naphthoquinoneNIPPON CATALYTIC CHEM IND·Filed 1974·Granted Mar 2, 1976·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →