Inventor · disambiguated record
Yutaka Okuyama
Also filed as: OKUYAMA YUTAKA
14 granted patents·7 pending applications·19 citations·filing 1979–2023
86Inventor score
Top patents by PatentIndex Score
21 records- 0190US11907235B2Plasma processing apparatus including predictive controlHITACHI HIGH TECH CORP·Filed 2021·Granted Feb 20, 2024·2 cites·3 claims
- 0281US11657059B2Search device, searching method, and plasma processing apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted May 23, 2023·2 cites·5 claims
- 0380US8319274B2Semiconductor deviceHISAMOTO DIGH·Filed 2007·Granted Nov 27, 2012·9 cites·15 claims
- 0471US2023222131A1Search device, searching method, and plasma processing apparatusHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 0562US8581328B2Semiconductor memory deviceOKUYAMA YUTAKA·Filed 2011·Granted Nov 12, 2013·3 cites·21 claims
- 0659US11663713B2Image generation systemHITACHI LTD·Filed 2021·Granted May 30, 2023·0 cites·17 claims
- 0758US2024353803A1Computer system and apparatus condition search support methodHITACHI LTD·Filed 2022·Application pending·0 cites
- 0855US12345522B2Computer system, dimension measurement method, and storage mediumHITACHI HIGH TECH CORP·Filed 2021·Granted Jul 1, 2025·0 cites·15 claims
- 0952US11747774B2Search device, search program, and plasma processing apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 5, 2023·0 cites·12 claims
- 1052US2025182261A1Computer system, dimension measuring method, and semiconductor device manufacturing systemHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1150US10560762B2Sensing system, sensing method, and concentratorHITACHI LTD·Filed 2018·Granted Feb 11, 2020·0 cites·15 claims
- 1249US2024200938A1Contour line analysis apparatus, processing dimension extraction system, processing condition decision system, semiconductor device manufacturing system, and data structureHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1348US12320630B2Dimension measurement apparatus, semiconductor manufacturing apparatus, and semiconductor device manufacturing systemHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 3, 2025·0 cites·14 claims
- 1447US10483779B2Status determining method for secondary battery, status determining apparatus for secondary battery, secondary battery system, and charge/discharge control apparatus having status determining apparatusHITACHI LTD·Filed 2013·Granted Nov 19, 2019·0 cites·7 claims
- 1546US11600536B2Dimension measurement apparatus, dimension measurement program, and semiconductor manufacturing systemHITACHI HIGH TECH CORP·Filed 2019·Granted Mar 7, 2023·0 cites·20 claims
- 1643US2014092688A1Non-Volatile Semiconductor Storage DeviceRENESAS ELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 1740US2011235419A1Non-volatile semiconductor storage deviceRENESAS ELECTRONICS CORP·Filed 2011·Application pending·0 cites
- 1840US2014008716A1Semiconductor device and manufacturing method thereofRENESAS ELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 1938US8385124B2Semiconductor device and manufacturing method thereofRENESAS ELECTRONICS CORP·Filed 2011·Granted Feb 26, 2013·0 cites·30 claims
- 2037US8044455B2Semiconductor device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2010·Granted Oct 25, 2011·0 cites·19 claims
- 2126US4263351ACoating methodTORAY INDUSTRIES·Filed 1979·Granted Apr 21, 1981·3 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →