Inventor · disambiguated record
Yuko Otani
Also filed as: OTANI YUKO
18 granted patents·9 pending applications·67 citations·filing 1999–2024
92Inventor score
Files withHITACHI HIGH TECH CORP21OTANI YUKO3ISSHIKI YASUHIRO1MATSUMURA TAKU1MATSUSHITA ELECTRIC INDUSTRIAL CO LTD1
Top patents by PatentIndex Score
27 records- 0195US10267745B2Defect detection method and defect detection device and defect observation device provided with sameHITACHI HIGH TECH CORP·Filed 2017·Granted Apr 23, 2019·7 cites·6 claims
- 0291US9436990B2Defect observation method and device thereforHITACHI HIGH TECH CORP·Filed 2012·Granted Sep 6, 2016·15 cites·18 claims
- 0388US10401300B2Defect observation method and device and defect detection deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Sep 3, 2019·4 cites·8 claims
- 0486US10642164B2Defect detection device and defect observation deviceHITACHI HIGH TECH CORP·Filed 2017·Granted May 5, 2020·3 cites·8 claims
- 0584US10436576B2Defect reviewing method and deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 8, 2019·5 cites·4 claims
- 0683US9733194B2Method for reviewing a defect and apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Aug 15, 2017·2 cites·15 claims
- 0782US9683946B2Method and device for detecting defects and method and device for observing defectsHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 20, 2017·4 cites·6 claims
- 0881US10228332B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2015·Granted Mar 12, 2019·2 cites·14 claims
- 0979US10593062B2Defect observation apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 17, 2020·2 cites·12 claims
- 1078US11802841B2Defect detection device, defect detection method, and defect observation deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 31, 2023·2 cites·13 claims
- 1178US9759666B2Defect detection method and defect detection device and defect observation device provided with sameHITACHI HIGH TECH CORP·Filed 2015·Granted Sep 12, 2017·1 cites·10 claims
- 1273US9773641B2Method and apparatus for observing defectsOTANI YUKO·Filed 2011·Granted Sep 26, 2017·3 cites·16 claims
- 1370US8953156B2Defect detection method and defect detection device and defect observation device provided with sameOTANI YUKO·Filed 2010·Granted Feb 10, 2015·1 cites·12 claims
- 1468US2025046566A1Optical Apparatus and Charged Particle Beam ApparatusHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 1566US9217718B2Defect detection method and defect detection device and defect observation device provided with sameHITACHI HIGH TECH CORP·Filed 2014·Granted Dec 22, 2015·0 cites·12 claims
- 1661US6577587B1Turntable device and manufacturing method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Jun 10, 2003·16 cites·28 claims
- 1752US2024231064A9Optical filtering device, method of controlling optical filtering device, and mems shutterHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1851US9685658B2Composite particles for electrochemical device electrode, material for electrochemical device electrode, and electrochemical device electrodeMATSUMURA TAKU·Filed 2012·Granted Jun 20, 2017·0 cites·13 claims
- 1951US2025291170A1Optical filtering device and mems shutterHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 2046US2022308331A1Microscope SystemHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 2145US11982631B2Defect detection device, defect detection method, and defect observation apparatus including defect detection deviceHITACHI HIGH TECH CORP·Filed 2019·Granted May 14, 2024·0 cites·13 claims
- 2245US10770260B2Defect observation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 8, 2020·0 cites·14 claims
- 2345US2024280520A1Inspection Device and Inspection MethodHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2442US2014342225A1Electrode for electrochemical deviceISSHIKI YASUHIRO·Filed 2012·Application pending·0 cites
- 2537US2014204194A1Defect observation method and device thereforOTANI YUKO·Filed 2012·Application pending·0 cites
- 2635US2016211112A1Method and Apparatus for Reviewing DefectsHITACHI HIGH TECH CORP·Filed 2016·Application pending·0 cites
- 2734US2017328842A1Defect observation method and defect observation deviceHITACHI HIGH TECH CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →