Inventor · disambiguated record
Yuichi Ozawa
Also filed as: OZAWA YUICHI
12 granted patents·6 pending applications·47 citations·filing 1985–2024
87Inventor score
Top patents by PatentIndex Score
18 records- 0182US9664733B2Probe device for testing electrical characteristics of semiconductor elementTOKYO SEIMITSU CO LTD·Filed 2015·Granted May 30, 2017·3 cites·9 claims
- 0274US9442156B2Alignment support device and alignment support method for probe deviceTOKYO SEIMITSU CO LTD·Filed 2015·Granted Sep 13, 2016·2 cites·14 claims
- 0372US4653571AMethod for horizontal continuous casting of a metal, where the lower mold/cast metal contact point is horizontally displacedSHOWA ALUMINIUM IND·Filed 1985·Granted Mar 31, 1987·13 cites·1 claims
- 0468US4688624AApparatus for horizontal continuous casting of metalSHOWA ALUMINIUM IND·Filed 1986·Granted Aug 25, 1987·11 cites·1 claims
- 0566US7561999B2Verification apparatus, verification method, and programFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Jul 14, 2009·12 cites·10 claims
- 0664US12455538B2Wrist watch and strapSEIKO EPSON CORP·Filed 2022·Granted Oct 28, 2025·0 cites·8 claims
- 0762US11485801B2Crystalline radical polymerizable composition for electrical and electronic component, molded article of electrical and electronic component using the composition, and method of the molded article of electrical and electronic componentJAPAN U PICA CO LTD·Filed 2018·Granted Nov 1, 2022·1 cites·21 claims
- 0858US10481177B2Wafer inspection methodTOKYO SEIMITSU CO LTD·Filed 2014·Granted Nov 19, 2019·1 cites·5 claims
- 0957US2024085806A1Stage apparatus, pattern forming apparatus, and method for manufacturing articleCANON KK·Filed 2023·Application pending·0 cites
- 1051US2024248377A1CameraNIDEC PREC CORPORATION·Filed 2024·Application pending·0 cites
- 1149US8250545B2Associated apparatus and method for supporting development of semiconductor deviceSATOH TETSUYA·Filed 2003·Granted Aug 21, 2012·4 cites·16 claims
- 1247US2023086148A1Rotor core and method of manufacturing rotor coreAISIN CORP·Filed 2021·Application pending·0 cites
- 1346US9983256B2Probing device for electronic device and probing methodTOKYO SEIMITSU CO LTD·Filed 2014·Granted May 29, 2018·0 cites·7 claims
- 1445US11921405B2CameraNIDEC COPAL CORP·Filed 2020·Granted Mar 5, 2024·0 cites·6 claims
- 1545US2019055621A1High-strength galvanized steel sheet and method for producing the sameJFE STEEL CORP·Filed 2017·Application pending·0 cites
- 1641US2023082542A1A crystalline radical polymerizable composition for fixing a magnet of a rotating electric machine rotor core, a rotating electric machine rotor core using the composition, and a method of manufacturing the rotating electric machine rotor coreJAPAN U PICA CO LTD·Filed 2021·Application pending·0 cites
- 1739US8988656B2Exposure apparatus, calibration method, and method of manufacturing articleCANON KK·Filed 2013·Granted Mar 24, 2015·0 cites·9 claims
- 1834US2023318415A1Method for manufacturing rotor coreAISIN CORP·Filed 2021·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Yuichi Ozawa files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →