Inventor · disambiguated record
Yuzuru Shibazaki
Also filed as: SHIBAZAKI YUZURU
9 granted patents·2 pending applications·26 citations·filing 2012–2024
83Inventor score
Top patents by PatentIndex Score
11 records- 0190US10957404B2Memory device which generates operation voltages in parallel with reception of an addressTOSHIBA MEMORY CORP·Filed 2019·Granted Mar 23, 2021·7 cites·18 claims
- 0290US2025046384A1Memory device which generates operation voltages in parallel with reception of an addressKIOXIA CORP·Filed 2024·Application pending·0 cites
- 0389US9202575B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted Dec 1, 2015·14 cites·19 claims
- 0482US11257551B2Memory device which generates operation voltages in parallel with reception of an addressTOSHIBA MEMORY CORP·Filed 2021·Granted Feb 22, 2022·1 cites·20 claims
- 0576US12159677B2Memory device which generates operation voltages in parallel with reception of an addressKIOXIA CORP·Filed 2023·Granted Dec 3, 2024·0 cites·19 claims
- 0672US10896735B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Jan 19, 2021·3 cites·20 claims
- 0770US11705210B2Memory device which generates operation voltages in parallel with reception of an addressKIOXIA CORP·Filed 2022·Granted Jul 18, 2023·0 cites·18 claims
- 0845US8780667B2Semiconductor memory deviceSHIBAZAKI YUZURU·Filed 2012·Granted Jul 15, 2014·1 cites·20 claims
- 0944US11869597B2Semiconductor storage device including a voltage generator for applying first and second intermediate voltages to an adjacent word line in a program operationKIOXIA CORP·Filed 2021·Granted Jan 9, 2024·0 cites·8 claims
- 1044US11694754B2Semiconductor memory device that provides a memory dieKIOXIA CORP·Filed 2021·Granted Jul 4, 2023·0 cites·18 claims
- 1137US2015255162A1Semiconductor memory device and method for detecting leak currentTOSHIBA KK·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →