Inventor · disambiguated record
Yuichiro Shimizu
Also filed as: SHIMIZU YUICHIRO
29 granted patents·11 pending applications·62 citations·filing 2004–2025
94Inventor score
Top patents by PatentIndex Score
40 records- 0195US9859201B2Wiring substrate, semiconductor device, and method for manufacturing wiring substrateSHINKO ELECTRIC IND CO·Filed 2015·Granted Jan 2, 2018·18 cites·9 claims
- 0292US9746433B2X-ray fluorescence spectrometer and X-ray fluorescence analyzing methodRIGAKU DENKI CO LTD·Filed 2016·Granted Aug 29, 2017·5 cites·7 claims
- 0385US9988704B2Manufacturing method of nitrided steel memberDOWA THERMOTECH CO LTD·Filed 2017·Granted Jun 5, 2018·1 cites·1 claims
- 0480US9598760B2Nitrided steel member and manufacturing method thereofSHIMIZU YUICHIRO·Filed 2012·Granted Mar 21, 2017·2 cites·4 claims
- 0578US10385439B2Nitriding process method of steel memberDOWA THERMOTECH CO LTD·Filed 2014·Granted Aug 20, 2019·1 cites·5 claims
- 0674US9392705B2Wiring board with through wiringSHINKO ELECTRIC IND CO·Filed 2014·Granted Jul 12, 2016·3 cites·6 claims
- 0774US7800878B2Power supply control circuit, and electronic control device, power supplying circuit, and power control integrated circuit equipped with power supply control circuitFUJITSU TEN LTD·Filed 2007·Granted Sep 21, 2010·12 cites·19 claims
- 0872US9783879B2Nitrided steel member and manufacturing method thereofDOWA THERMOTECH CO LTD·Filed 2013·Granted Oct 10, 2017·1 cites·4 claims
- 0970US9040832B2Wiring substrate and method of manufacturing the sameSHIMIZU YUICHIRO·Filed 2012·Granted May 26, 2015·3 cites·4 claims
- 1070US8819401B2Semiconductor device and reset control method in semiconductor deviceSHIMIZU YUICHIRO·Filed 2011·Granted Aug 26, 2014·3 cites·13 claims
- 1167US9829509B2Probe guide plate and semiconductor inspection apparatusSHINKO ELECTRIC IND CO·Filed 2014·Granted Nov 28, 2017·2 cites·7 claims
- 1267US8030027B2Method for enhancing recombinant antibody productionST JUDE CHILDRENS RES HOSPITAL·Filed 2009·Granted Oct 4, 2011·2 cites·1 claims
- 1366US9232644B2Wiring substrateSHINKO ELECTRIC IND CO·Filed 2013·Granted Jan 5, 2016·1 cites·4 claims
- 1464US2025223315A1Protein purification with protein lCHUGAI PHARMACEUTICAL CO LTD·Filed 2025·Application pending·0 cites
- 1558US7213097B2Electronic control unit and electronic driving unitFUJITSU TEN LTD·Filed 2004·Granted May 1, 2007·7 cites·24 claims
- 1657US7684468B2Wireless communication deviceSONY CORP·Filed 2006·Granted Mar 23, 2010·1 cites·5 claims
- 1755US11811009B2Light emitting device with wiring enclosed by ceramic substrateSHINKO ELECTRIC IND CO·Filed 2021·Granted Nov 7, 2023·0 cites·7 claims
- 1853US10139430B2Probe guide, probe card, and method for probe guide manufacturingJAPAN ELECTRONIC MAT CORPORATION·Filed 2017·Granted Nov 27, 2018·0 cites·7 claims
- 1953US2020190138A1Protein purification with protein lCHUGAI PHARMACEUTICAL CO LTD·Filed 2018·Application pending·0 cites
- 2051US10386387B2Probe guide plate and probe deviceSHINKO ELECTRIC IND CO·Filed 2017·Granted Aug 20, 2019·0 cites·13 claims
- 2149US2019391069A1Flow cellSHINKO ELECTRIC IND CO·Filed 2019·Application pending·0 cites
- 2248US9054579B2Power supply circuitFUJITSU TEN LTD·Filed 2013·Granted Jun 9, 2015·0 cites·5 claims
- 2347US2007116594A1Analytical microchipSHARP KK·Filed 2006·Application pending·0 cites
- 2445US11359271B2Nitriding treatment method of steel memberDOWA THERMOTECH CO LTD·Filed 2016·Granted Jun 14, 2022·0 cites·5 claims
- 2545US2009029506A1Method of manufacturing semiconductor deviceSHINKO ELECTRIC IND CO·Filed 2008·Application pending·0 cites
- 2645US2022213140A1Method for purifying fc region-modified antibodyCHUGAI PHARMACEUTICAL CO LTD·Filed 2020·Application pending·0 cites
- 2743US10261110B2Probe guide plate having a silicon oxide layer formed on surfaces and on an inner wall of a through hole thereof, and a protective insulating layer formed on the silicon oxide layer, and probe apparatus including the probe guide plateSHINKO ELECTRIC IND CO·Filed 2016·Granted Apr 16, 2019·0 cites·9 claims
- 2843US2007281366A1Target molecule recognition polymer and method for producing the sameSHARP KK·Filed 2007·Application pending·0 cites
- 2942US9014942B2Idling stop device and idling stop control methodIZUMOTO RYOH·Filed 2011·Granted Apr 21, 2015·0 cites·5 claims
- 3042US2013260481A1Analysis device and analysis methodSHIMIZU YUICHIRO·Filed 2011·Application pending·0 cites
- 3141US9080993B2Microdevice, microchip apparatus and analysis method utilizing the sameASANO NAOMI·Filed 2009·Granted Jul 14, 2015·0 cites·10 claims
- 3241US2011226621A1Target recognition molecule and a method for immobilizing the sameSHARP KK·Filed 2010·Application pending·0 cites
- 3340US8493095B2Semiconductor device with clock stop detectionSHIMIZU YUICHIRO·Filed 2011·Granted Jul 23, 2013·0 cites·6 claims
- 3440US2011017599A1Target recognition molecule and a method for immobilizing the sameSHARP KK·Filed 2010·Application pending·0 cites
- 3539US10309988B2Probe guide plate and probe deviceSHINKO ELECTRIC IND CO·Filed 2017·Granted Jun 4, 2019·0 cites·5 claims
- 3639US8887684B2Idling stop apparatus and method for disabling idling stop functionIZUMOTO RYOH·Filed 2010·Granted Nov 18, 2014·0 cites·6 claims
- 3737US7977569B2Dye sensitized solar cell module and manufacturing method thereofSHINKO ELECTRIC IND CO·Filed 2007·Granted Jul 12, 2011·0 cites·6 claims
- 3836US8674533B2Engine control device, vehicle, and engine control methodSHIMIZU YUICHIRO·Filed 2010·Granted Mar 18, 2014·0 cites·17 claims
- 3933US8702963B2Electrochemical measurement electrode, electrochemical measurement electrode chip, and electrochemical measuring method and analysis method using the sameASANO NAOMI·Filed 2011·Granted Apr 22, 2014·0 cites·19 claims
- 4030US2012298528A1Biosensor and analysis method using sameASANO NAOMI·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →