Inventor · disambiguated record
Yu-Min Sun
Also filed as: SUN YU · Sun yu-min
30 granted patents·12 pending applications·35 citations·filing 2007–2025
93Inventor score
Files withGLOBAL UNICHIP CORP28ADVANCED ANALOG TECHNOLOGY INC8CHUANG YUNG-CHUN2Sun yu-min2OXSYNS CO1
Top patents by PatentIndex Score
42 records- 0195US11340288B1Testing equipment, its component carrying device and testing method of the testing equipmentGLOBAL UNICHIP CORP·Filed 2021·Granted May 24, 2022·3 cites·19 claims
- 0288US10154612B1Electronic device having active heat dissipationGLOBAL UNICHIP CORP·Filed 2018·Granted Dec 11, 2018·6 cites·10 claims
- 0374US7446621B2Circuit and method for switching PFM and PWMADVANCED ANALOG TECHNOLOGY INC·Filed 2007·Granted Nov 4, 2008·8 cites·11 claims
- 0472US10274516B2Probe card system, probe loader device and manufacturing method of the probe loader deviceGLOBAL UNICHIP CORP·Filed 2017·Granted Apr 30, 2019·1 cites·9 claims
- 0571US10566217B2Drying apparatusGLOBAL UNICHIP CORP·Filed 2018·Granted Feb 18, 2020·1 cites·10 claims
- 0670US10502775B2Testing equipment for semiconductor element and its carrying deviceGLOBAL UNICHIP CORP·Filed 2017·Granted Dec 10, 2019·1 cites·10 claims
- 0768US12140623B2Testing apparatusGLOBAL UNICHIP CORP·Filed 2023·Granted Nov 12, 2024·0 cites·20 claims
- 0866US2025370035A1Heterogeneous thermal interface material element and pressing test device having the sameGLOBAL UNICHIP CORP·Filed 2025·Application pending·0 cites
- 0965US11703244B2Testing apparatusGLOBAL UNICHIP CORP·Filed 2020·Granted Jul 18, 2023·0 cites·17 claims
- 1065US11624759B1Inspecting device and its testing socketGLOBAL UNICHIP CORP·Filed 2022·Granted Apr 11, 2023·0 cites·20 claims
- 1162US2025277810A1Testing apparatus and its conductive terminalGLOBAL UNICHIP CORP·Filed 2024·Application pending·0 cites
- 1261US8026705B2Bootstrap circuit and bulk circuit thereofADVANCED ANALOG TECHNOLOGY INC·Filed 2009·Granted Sep 27, 2011·8 cites·28 claims
- 1361US2025277812A1Testing apparatus of packaged modules and its manufacturing methodGLOBAL UNICHIP CORP·Filed 2024·Application pending·0 cites
- 1460US11852470B2Inspecting deviceGLOBAL UNICHIP CORP·Filed 2020·Granted Dec 26, 2023·0 cites·20 claims
- 1560US2025026029A1Element pickup mechanismGLOBAL UNICHIP CORP·Filed 2023·Application pending·0 cites
- 1658US12252729B2Enzymatic electrode system and its applicationsOXSYNS CO·Filed 2024·Granted Mar 18, 2025·0 cites·19 claims
- 1757US8487642B2Burn-in socket and testing fixture using the sameSun yu-min·Filed 2010·Granted Jul 16, 2013·1 cites·8 claims
- 1854US12484149B2Electric device, its circuit board and method of manufacturing the electric deviceGLOBAL UNICHIP CORP·Filed 2022·Granted Nov 25, 2025·0 cites·8 claims
- 1954US11740260B2Pogo pin-free testing device for IC chip test and testing method of IC chipGLOBAL UNICHIP CORP·Filed 2022·Granted Aug 29, 2023·0 cites·11 claims
- 2054US11156639B2Probe card moduleGLOBAL UNICHIP CORP·Filed 2020·Granted Oct 26, 2021·0 cites·10 claims
- 2153US10598724B2Testing system for semiconductor package components and its thermal barrier layer elementGLOBAL UNICHIP CORP·Filed 2017·Granted Mar 24, 2020·0 cites·15 claims
- 2253US10041817B2Damping component and integrated-circuit testing apparatus using the sameGLOBAL UNICHIP CORP·Filed 2017·Granted Aug 7, 2018·0 cites·9 claims
- 2353US7471117B2Circuit for detecting maximal frequency of pulse frequency modulation and method thereofADVANCED ANALOG TECHNOLOGY INC·Filed 2007·Granted Dec 30, 2008·2 cites·7 claims
- 2452US12243703B2Probe card device and circuit protection assembly thereofGLOBAL UNICHIP CORP·Filed 2022·Granted Mar 4, 2025·0 cites·18 claims
- 2552US11848250B2Thermal peak suppression deviceGLOBAL UNICHIP CORP·Filed 2021·Granted Dec 19, 2023·0 cites·11 claims
- 2652US9678110B2Probe cardGLOBAL UNICHIP CORP·Filed 2015·Granted Jun 13, 2017·0 cites·10 claims
- 2752US7495499B2Power transistor circuit and the method thereofADVANCED ANALOG TECHNOLOGY INC·Filed 2007·Granted Feb 24, 2009·4 cites·16 claims
- 2851US10132835B2Testing apparatus and its probe connectorGLOBAL UNICHIP CORP·Filed 2016·Granted Nov 20, 2018·0 cites·16 claims
- 2951US2023333141A1Conductive probe, method of manufacturing the same, and probe card device having the sameGLOBAL UNICHIP CORP·Filed 2022·Application pending·0 cites
- 3047US10048290B2Probe card deviceGLOBAL UNICHIP CORP·Filed 2016·Granted Aug 14, 2018·0 cites·15 claims
- 3147US2022291256A1Testing apparatus and its element pickup moduleGLOBAL UNICHIP CORP·Filed 2021·Application pending·0 cites
- 3246US11699457B2Testing system, crack noise monitoring device and method for monitoring crack noiseGLOBAL UNICHIP CORP·Filed 2021·Granted Jul 11, 2023·0 cites·18 claims
- 3340US10345834B2Sensing total current of distributed load circuits independent of current distribution using distributed voltage averagingQUALCOMM INC·Filed 2017·Granted Jul 9, 2019·0 cites·25 claims
- 3440US2010103575A1Floating protection circuit and photo-flash capacitor charger thereofCHUANG YUNG-CHUN·Filed 2009·Application pending·0 cites
- 3538US7551008B2Circuit for fixing peak current of an inductor and method thereofADVANCED ANALOG TECHNOLOGY INC·Filed 2007·Granted Jun 23, 2009·0 cites·13 claims
- 3638US7456622B2Circuit for starting up a synchronous step-up DC/DC converter and the method thereofADVANCED ANALOG TECHNOLOGY INC·Filed 2007·Granted Nov 25, 2008·0 cites·11 claims
- 3737US7501908B2Oscillation circuit having current scaling relationship and the method for using the sameADVANCED ANALOG TECHNOLOGY INC·Filed 2007·Granted Mar 10, 2009·0 cites·9 claims
- 3835US2017045554A1Circuit probing system and its circuit probing deviceGLOBAL UNICHIP CORP·Filed 2015·Application pending·0 cites
- 3935US2017052218A1Testing unit and testing apparatus using the sameGLOBAL UNICHIP CORP·Filed 2016·Application pending·0 cites
- 4034US2010109613A1Switch control circuit with voltage sensing function and camera flash capacitor charger thereofCHUANG YUNG-CHUN·Filed 2008·Application pending·0 cites
- 4133US2010102795A1Bandgap voltage reference circuitSun yu-min·Filed 2009·Application pending·0 cites
- 4232US2009174373A1Clamp circuit and combinational circuit thereofADVANCED ANALOG TECHNOLOGY INC·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →