Inventor · disambiguated record
Yukihide Suzuki
Also filed as: SUZUKI YUKIHIDE
27 granted patents·694 citations·filing 1989–2021
97Inventor score
Top patents by PatentIndex Score
27 records- 0193US5021998ASemiconductor memory device with low-house pads for electron beam testHITACHI LTD·Filed 1989·Granted Jun 4, 1991·88 cites·15 claims
- 0292US5969996ASemiconductor memory device and memory systemHIACHI LTD·Filed 1998·Granted Oct 19, 1999·80 cites·43 claims
- 0388US11322194B2Compensating offsets in buffers and related systems, methods, and devicesMICRON TECHNOLOGY INC·Filed 2021·Granted May 3, 2022·2 cites·20 claims
- 0487US7216198B2DRAM with super self-refresh and error correction for extended period between refresh operationsHITACHI LTD·Filed 2003·Granted May 8, 2007·63 cites·12 claims
- 0582US5625234ASemiconductor memory device with bit line and select line arrangement maintaining parasitic capacitance in equilibriumTEXAS INSTRUMENTS INC·Filed 1994·Granted Apr 29, 1997·50 cites·11 claims
- 0680US6518835B2Semiconductor integrated circuit device having an optimal circuit layout to ensure stabilization of internal source voltages without lowering circuit functions and/or operating performanceHITACHI LTD·Filed 2002·Granted Feb 11, 2003·26 cites·12 claims
- 0780US5818784ASemiconductor memory device and memory systemHITACHI LTD·Filed 1996·Granted Oct 6, 1998·33 cites·6 claims
- 0878US10937486B1Compensating offsets in buffers and related systems, methods, and devicesMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 2, 2021·3 cites·20 claims
- 0977US6707139B2Semiconductor device with plural unit regions in which one or more MOSFETs are formedHITACHI LTD·Filed 2001·Granted Mar 16, 2004·23 cites·3 claims
- 1076US5301142ASemiconductor memoryHITACHI LTD·Filed 1992·Granted Apr 5, 1994·36 cites·23 claims
- 1174US5764580ASemiconductor integrated circuitHITACHI LTD·Filed 1996·Granted Jun 9, 1998·34 cites·24 claims
- 1273US6064605ASemiconductor memory device and memory systemHITACHI LTD·Filed 1999·Granted May 16, 2000·23 cites·1 claims
- 1369US6633508B2Semiconductor memory device and memory systemHITACHI LTD·Filed 2001·Granted Oct 14, 2003·11 cites·20 claims
- 1469US5862086ASemiconductor storage deviceHITACHI LTD·Filed 1996·Granted Jan 19, 1999·32 cites·20 claims
- 1567US5598373ASemiconductor memory systemHITACHI LTD·Filed 1995·Granted Jan 28, 1997·29 cites·8 claims
- 1666US5557580AWord line driving circuitTEXAS INSTRUMENTS INC·Filed 1994·Granted Sep 17, 1996·27 cites·6 claims
- 1765US5761149ADynamic RAMHITACHI LTD·Filed 1996·Granted Jun 2, 1998·22 cites·22 claims
- 1864US6274895B1Semiconductor integrated circuit deviceHITACHI LTD·Filed 1999·Granted Aug 14, 2001·27 cites·18 claims
- 1958US6411160B1Semiconductor integrated circuit deviceHITACHI LTD·Filed 1999·Granted Jun 25, 2002·20 cites·20 claims
- 2058US5831910ASemiconductor integrated circuit utilizing overdriven differential amplifiersHITACHI LTD·Filed 1996·Granted Nov 3, 1998·19 cites·18 claims
- 2151US6282141B1Semiconductor memory device and memory systemHITACHI LTD·Filed 2000·Granted Aug 28, 2001·4 cites·11 claims
- 2250US7710142B2Semiconductor integrated circuitELPIDA MEMORY INC·Filed 2008·Granted May 4, 2010·2 cites·12 claims
- 2346US5497349ADynamic random access memory device having first and second I/O line groups isolated from each otherHITACHI LTD·Filed 1994·Granted Mar 5, 1996·11 cites·6 claims
- 2444US5615156ASemiconductor memory device having plural memory mats with centrally located reserve bit or word linesTEXAS INSTRUMENTS INC·Filed 1994·Granted Mar 25, 1997·10 cites·9 claims
- 2543US5844915AMethod for testing word line leakage in a semiconductor memory deviceTEXAS INSTRUMENTS INC·Filed 1996·Granted Dec 1, 1998·9 cites·6 claims
- 2638US5805522AAddress access path control circuitTEXAS INSTURMENTS INC·Filed 1996·Granted Sep 8, 1998·6 cites·7 claims
- 2734US5768214ASemiconductor memory deviceTEXAS INSTRUMENTS INC·Filed 1996·Granted Jun 16, 1998·4 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →