Inventor · disambiguated record
Yuuji Takada
Also filed as: TAKADA YUUJI
2 granted patents·0 citations·filing 2009–2014
27Inventor score
Technology areasH10W
Top patents by PatentIndex Score
2 records- 0153US9362184B2Semiconductor device, manufacturing method of semiconductor device, semiconductor manufacturing and inspecting apparatus, and inspecting apparatusRENESAS ELECTRONICS CORP·Filed 2014·Granted Jun 7, 2016·0 cites·12 claims
- 0244US8946895B2Semiconductor device, manufacturing method of semiconductor device, semiconductor manufacturing and inspecting apparatus, and inspecting apparatusKATO TAKAHIKO·Filed 2009·Granted Feb 3, 2015·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →