Inventor · disambiguated record
Yukitsugu Takasuka
Also filed as: TAKASUKA YUKITSUGU
1 granted patent·2 pending applications·0 citations·filing 2006–2010
7Inventor score
Top patents by PatentIndex Score
3 records- 0123US2011113286A1Scan test circuit and scan test methodRENESAS ELECTRONICS CORP·Filed 2010·Application pending·0 cites
- 0222US2011060952A1Semiconductor integrated circuitRENESAS ELECTRONICS CORP·Filed 2010·Application pending·0 cites
- 0320US7552372B2Semiconductor device and test method thereofNEC ELECTRONICS CORP·Filed 2006·Granted Jun 23, 2009·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →