Inventor · disambiguated record
Yukihisa Wada
Also filed as: WADA YUKIHISA
42 granted patents·21 pending applications·320 citations·filing 1991–2023
97Inventor score
Files withSHIMADZU CORP19NGK INSULATORS LTD18TOKYO OHKA KOGYO CO LTD13MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4WADA YUKIHISA3
Top patents by PatentIndex Score
63 records- 0186US6664196B1Method of cleaning electronic device and method of fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Dec 16, 2003·36 cites·8 claims
- 0286US5316710AProcess for producing ceramic honeycomb structural bodiesNGK INSULATORS LTD·Filed 1992·Granted May 31, 1994·60 cites·3 claims
- 0386US5262102AProcess for firing ceramic honeycomb structural bodiesNGK INSULATORS LTD·Filed 1992·Granted Nov 16, 1993·44 cites·3 claims
- 0485US7029511B2Si-containing honeycomb structure and process for production thereofNGK INSULATORS LTD·Filed 2003·Granted Apr 18, 2006·27 cites·9 claims
- 0583US6803086B2Porous honeycomb structure body, the use thereof and method for manufacturing the sameNGK INSULATORS LTD·Filed 2002·Granted Oct 12, 2004·41 cites·11 claims
- 0682US10468365B2Semiconductor device and semiconductor detector, methods for manufacturing same, and semiconductor chip or substrateSHIMADZU CORP·Filed 2015·Granted Nov 5, 2019·4 cites·6 claims
- 0780US7267127B2Method for manufacturing electronic deviceMATSUSHITA ELECTRIC INDUCTRIAL·Filed 2005·Granted Sep 11, 2007·7 cites·12 claims
- 0873US7294304B2Die for forming honeycomb structure and method of manufacturing honeycomb structureNGK INSULATORS LTD·Filed 2005·Granted Nov 13, 2007·2 cites·4 claims
- 0972US6830979B2Method for fabricating semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Dec 14, 2004·15 cites·17 claims
- 1070US5149264AMethod of producing ceramic productsNGK INSULATORS LTD·Filed 1991·Granted Sep 22, 1992·14 cites·7 claims
- 1168US10643760B2Method of producing diffraction gratingSHIMADZU CORP·Filed 2018·Granted May 5, 2020·1 cites·18 claims
- 1267US7760356B2Optical measuring device and method, and nanoparticle measuring method and deviceSHIMADZU CORP·Filed 2005·Granted Jul 20, 2010·4 cites·14 claims
- 1367US7052735B2Method of plugging at least some of the cells of a honeycomb structureNGK INSULATORS LTD·Filed 2003·Granted May 30, 2006·13 cites·8 claims
- 1466US9341566B2Resin type identification method and resin type identification apparatusMITSUBISHI ELECTRIC CORP·Filed 2014·Granted May 17, 2016·1 cites·21 claims
- 1565US12187943B2Chemical solution used for cleaning or etching ruthenium-containing layer and method for fabricating ruthenium wiringTOKYO OHKA KOGYO CO LTD·Filed 2022·Granted Jan 7, 2025·0 cites·11 claims
- 1665US7911610B2Optical measuring deviceSHIMADZU CORP·Filed 2006·Granted Mar 22, 2011·2 cites·7 claims
- 1763US7040327B2Die cleaning methodNGK INSULATORS LTD·Filed 2003·Granted May 9, 2006·5 cites·6 claims
- 1862US7824504B2Electronic device cleaning equipment and electronic device cleaning methodPANASONIC CORP·Filed 2006·Granted Nov 2, 2010·1 cites·12 claims
- 1961US7429351B2Method for manufacturing a porous ceramic structureNGK INSULATORS LTD·Filed 2004·Granted Sep 30, 2008·6 cites·15 claims
- 2061US7413625B2Bonding method of ceramic honeycomb structureNGK INSULATORS LTD·Filed 2004·Granted Aug 19, 2008·8 cites·3 claims
- 2160US7431873B2Method for manufacturing honeycomb structureNGK INSULATORS LTD·Filed 2003·Granted Oct 7, 2008·2 cites·13 claims
- 2260US6613636B2Method for fabricating semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Sep 2, 2003·7 cites·14 claims
- 2360US2023265362A1Rinsing solution, method of treating substrate, and method of manufacturing semiconductor deviceTOKYO OHKA KOGYO CO LTD·Filed 2023·Application pending·0 cites
- 2460US2008115383A1Method of drying honeycomb formed bodyNGK INSULATORS LTD·Filed 2008·Application pending·0 cites
- 2558US8313628B2Method and apparatus for evaluating dielectrophoretic intensity of microparticleTSUNAZAWA YOSHIO·Filed 2006·Granted Nov 20, 2012·1 cites·6 claims
- 2658US8274654B2Apparatus for measuring nanoparticlesWADA YUKIHISA·Filed 2007·Granted Sep 25, 2012·1 cites·12 claims
- 2757US2023203409A1Cleaning liquid and method for cleaning substrateTOKYO OHKA KOGYO CO LTD·Filed 2022·Application pending·0 cites
- 2856US11686002B2Method for manufacturing ruthenium wiringTOKYO OHKA KOGYO CO LTD·Filed 2021·Granted Jun 27, 2023·0 cites·7 claims
- 2956US11179124B2X-ray phase imaging methodSHIMADZU CORP·Filed 2020·Granted Nov 23, 2021·0 cites·11 claims
- 3055US11518937B2Etching solution and method for manufacturing semiconductor elementTOKYO OHKA KOGYO CO LTD·Filed 2020·Granted Dec 6, 2022·0 cites·11 claims
- 3155US11166687B2X-ray imaging apparatusSHIMADZU CORP·Filed 2018·Granted Nov 9, 2021·0 cites·19 claims
- 3254US11898081B2Ruthenium-etching solution, method for manufacturing ruthenium-etching solution, method for processing object to be processed, and method for manufacturing ruthenium-containing wiringTOKYO OHKA KOGYO CO LTD·Filed 2020·Granted Feb 13, 2024·0 cites·6 claims
- 3353US12104260B2Method for producing semiconductor element and chemical solution to be used in method for producing semiconductor elementTOKYO OHKA KOGYO CO LTD·Filed 2021·Granted Oct 1, 2024·0 cites·5 claims
- 3453US11268916B2X-ray phase imaging systemSHIMADZU CORP·Filed 2019·Granted Mar 8, 2022·0 cites·15 claims
- 3553US11120994B2Etching solution, and method of producing semiconductor elementTOKYO OHKA KOGYO CO LTD·Filed 2019·Granted Sep 14, 2021·0 cites·4 claims
- 3653US2025336634A1X-ray imaging apparatus and x-ray imaging methodSHIMADZU CORP·Filed 2022·Application pending·0 cites
- 3752US11327029B2X-ray imaging deviceSHIMADZU CORP·Filed 2019·Granted May 10, 2022·0 cites·9 claims
- 3852US10729398B2Radiation phase contrast imaging deviceSHIMADZU CORP·Filed 2017·Granted Aug 4, 2020·0 cites·7 claims
- 3952US2022194791A1Method for producing aqueous solution of purified orthoperiodic acid, method for producing semiconductor device, and aqueous solution of orthoperiodic acidTOKYO OHKA KOGYO CO LTD·Filed 2021·Application pending·0 cites
- 4051US11272894B2X-ray imaging deviceSHIMADZU CORP·Filed 2019·Granted Mar 15, 2022·0 cites·13 claims
- 4151US2023203408A1Cleaning liquid and method for cleaning substrateTOKYO OHKA KOGYO CO LTD·Filed 2022·Application pending·0 cites
- 4249US2025382724A1Silicon carbide single crystal substrate processing method, and silicon carbide single crystal substrate processing systemTOKYO OHKA KOGYO CO LTD·Filed 2023·Application pending·0 cites
- 4348US11311260B2X-ray phase imaging apparatusSHIMADZU CORP·Filed 2020·Granted Apr 26, 2022·0 cites·13 claims
- 4448US7544320B2Method of manufacturing porous ceramic bodyNGK INSULATORS LTD·Filed 2003·Granted Jun 9, 2009·1 cites·5 claims
- 4548US2008257737A1Electrophoresis method, electrophoresis module and electrophoresis apparatusSHIMADZU CORP·Filed 2007·Application pending·0 cites
- 4648US2025369155A1Processing method for silicon carbide single crystal substrate, silicon carbide single crystal substrate processing system, and replenishing liquidTOKYO OHKA KOGYO CO LTD·Filed 2023·Application pending·0 cites
- 4747US5265346ADrying carrier adapted for carrying honeycomb structureNGK INSULATORS LTD·Filed 1992·Granted Nov 30, 1993·12 cites·9 claims
- 4847US2008049213A1Particle diameters measuring method and deviceSHIMADZU CORP·Filed 2007·Application pending·0 cites
- 4946US10859512B2X-ray phase contrast imaging apparatusSHIMADZU CORP·Filed 2017·Granted Dec 8, 2020·0 cites·11 claims
- 5045US2014063494A1Flow cellSHIMADZU CORP·Filed 2013·Application pending·0 cites
Showing the top 50 of 63 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Yukihisa Wada files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →